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Phase Identification in Heated Thermal Barrier Coatings using Microbeam X-ray Diffraction Combined with Quantitative X-ray Mapping

Published online by Cambridge University Press:  17 March 2011

Jennifer R. Verkouteren ,
Ryna B. Marinenko  and
David S. Bright
Jennifer R. Verkouteren
Affiliation:
Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, U.S.A.
Ryna B. Marinenko
Affiliation:
Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, U.S.A.
David S. Bright
Affiliation:
Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, U.S.A.
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Abstract

Phase evolution in a yttria-partially-stabilized zirconia (Y-PSZ) thermal barrier coating (TBC) was studied by using quantitative electron probe x-ray mapping combined with microbeam x-ray diffraction. The as-sprayed coating contains a single t' phase with the composition of the feedstock material. After annealing at 1400 °C for 1 hour, the yttria content of the t' phase increases slightly to compensate for the formation of 0.06 mass fraction of a t phase containing 0.01 mole fraction YO1.5. These results are in contrast to those determined by bulk x-ray and neutron diffraction, and therefore highlight the need for multiple techniques of phase analysis in Y-PSZ.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 645: Symposium M – Thermal Barrier Coatings-2000 , 2000 , MM8.4.1
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1. Scott, H.G., J. Mater. Sci., 10, 1527–35 (1975).Google Scholar
2. Yashima, M., Kakihana, M., and Yoshimura, M., Solid State Ionics, 86–88, 1131–49 (1996).Google Scholar
3. Miller, R.A., Smialek, J.L., and Garlick, R.G., in Advances in Ceramics, Vol. 3, Science and Technology of Zirconia I, edited by Heuer, A.H. and Hobbs, L.W. (American Ceramic Society, Columbus, OH, 1981), pp. 241–253.Google Scholar
4. Schulz, U., J. Am. Ceram. Soc., 83, 904–910 (2000).Google Scholar
5. Hammond, L.C. and Cocking, J.L., Powder Diffraction, 11, 75–79 (1996).Google Scholar
6. Scardi, P., Galvanetto, E., Tomasi, A., and Bertamini, L., Surface and Coatings Technology, 68/69, 106–112 (1994).Google Scholar
7. Argyriou, D.N. and Howard, C. J., J. Appl. Crystallogr., 28, 206–8 (1995).Google Scholar
8. Ilavsky, J. and Stalick, J. K., Surface and Coatings Technology, 127, 120–129 (2000).Google Scholar
9. Marinenko, R. B., Verkouteren, J.R., and Bright, D.S., this volume.Google Scholar
10. Kraus, W. and Nolze, G., J. Appl. Crystallogr., 29, 301–3 (1996).Google Scholar
11. Yashima, M., Sasaki, S., Kakihana, M., Yamaguchi, Y., Arashi, H., and Yoshimura, M., Acta Crystallogr., Sect. B: Struct. Sci., B50, 663–73 (1994).Google Scholar
12. Humphreys, F. J., J. Micros., 195, 170–185 (1999).Google Scholar