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The Phase Diagram of Hydrogen in Ultra Thin Films

Published online by Cambridge University Press:  15 February 2011

N. M. Jisrawi ,
W. Ruckman ,
G. Reisfeld ,
H. Wiesmann ,
F. Loeb ,
E. Gallego ,
Y. Gorelik ,
T. R. Thurston  and
Myron Strongin
N. M. Jisrawi
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
W. Ruckman
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
G. Reisfeld
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
H. Wiesmann
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
F. Loeb
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
E. Gallego
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
Y. Gorelik
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
T. R. Thurston
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
Myron Strongin
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, NY 11973
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Abstract

In this paper, we discuss changes in the phase diagram of hydrogen in both bilayer (i.e. 200–2000 Å Nb/ 100 Å Pd on glass) and multilayer configurations. In fact, it is the changes in this phase diagram, in addition to the Pd coating, that makes theses bilayer systems useful for hydrogen gas sensors. Comparison of x-ray diffraction, electrical resistivity and volumetric measurements of the films before and after hydrogen charging indicate that the phase equilibria between a correlated (high concentration) and a dilute phase of hydrogen in Nb is not sensitive to the number of layers in the films. On the other hand, the experimental methods show different behavior for 200 Å thick Nb films and thicker (>400 Å) Nb layers. Diffraction results showing unisotropic lattice expansion will also be discussed..

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 403: Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II , 1995 , 571
Copyright
Copyright © Materials Research Society 1996

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References

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