Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T17:43:04.011Z Has data issue: false hasContentIssue false

Perpendicular Giant Magnetoresistance of Co/Cu Multilayers with Fluctuating Co Layer Thicknesses

Published online by Cambridge University Press:  15 February 2011

Wen-C. Chiang
Affiliation:
Department of Physics and Astronomy, Center for Fundamental Materials Research, and Center for Sensor Materials, Michigan State University, East Lansing, MI 48824, [email protected]
R. Loloee
Affiliation:
Department of Physics and Astronomy, Center for Fundamental Materials Research, and Center for Sensor Materials, Michigan State University, East Lansing, MI 48824, [email protected]
W.P. Pratt Jr
Affiliation:
Department of Physics and Astronomy, Center for Fundamental Materials Research, and Center for Sensor Materials, Michigan State University, East Lansing, MI 48824, [email protected]
J. Bass
Affiliation:
Department of Physics and Astronomy, Center for Fundamental Materials Research, and Center for Sensor Materials, Michigan State University, East Lansing, MI 48824, [email protected]
Get access

Abstract

J. Mathon has predicted that introducing pseudorandom fluctuations (PRF) in the Co layer thickness could greatly enhance the Current Perpendicular to the Plane (CPP) magnetoresistance (MR) of a Co/Cu superlattice with dimensions comparable to the electron mean-free-path. We have searched for CPP-MR enhancement in sputtered Co/Cu multilayers with Cu layer thicknesses near both the first and second antiferromagnetically coupled peaks in the oscillatory region of the CPP-MR. In both cases, inserting PRF only decreased the CPP-MR.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Mathon, J., Phys. Rev. B54, 55 (1996);Google Scholar
Mathon, J., Phys. Rev. B55, 960 (1997).Google Scholar
2. Kelly, P.J., Schep, K.M., Bauer, G.E.W., Van Hoof, J.B.A.N., and Inglesfield, J.E., Bull. Am. Phys. Soc. 42, 568 (1997).Google Scholar
3. Slaughter, J.M., Pratt, W.P. Jr, and Schroeder, P.A., Rev. Sci. Inst. 60, 127 (1989);Google Scholar
Pratt, W.P. Jr, Lee, S.-F., Slaughter, J.M., Loloee, R., Schroeder, P.A., and Bass, J., Phys. Rev. Lett. 66, 3060 (1991).Google Scholar
4. Lee, S.-F., Pratt, W.P. Jr, Yang, Q., Holody, P., Loloee, R., Schroeder, P.A., and Bass, J., J. Magn. Magn. Mat. 118, L1 (1993).Google Scholar
5. Schroeder, P.A., Bass, J., Holody, P., Lee, S.-F., Loloee, R., Pratt, W.P. Jr, and Yang, Q., Mat. Res. Soc. Symp Proc. 313, 47 (1993).Google Scholar
6. Parkin, S.S.P., More, N., and Roche, K.P., Phys. Rev. Lett. 64, 2304 (1990);Google Scholar
Mosca, D.H., J. Magn. Magn. Mater. 94, L1 (1991).Google Scholar
7. Zhang, S. and Levy, P.M., J. Appl. Phys. 69, 4786 (1991).Google Scholar
8. Valet, T. and Fert, A., Phys. Rev. B48, 7099 (1993).Google Scholar
9. Yang, Q., Holody, P., Loloee, R., Henry, L.L., Pratt, W.P. Jr, Schroeder, P.A., and Bass, J., Phys. Rev. B51, 3226 (1995).Google Scholar