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Peculiarities of Determination of Recombination Parameters at Moderate and High Excitation Levels in Silicon Wafers

Published online by Cambridge University Press:  26 February 2011

E. Gaubas  and
A. Kaniava
E. Gaubas
Affiliation:
Vilnius university, Department of Physics, Sauletekio 10, 2054 Vilnius, Lithuania
A. Kaniava
Affiliation:
Vilnius university, Department of Physics, Sauletekio 10, 2054 Vilnius, Lithuania
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Abstract

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 378: Symposium B – Defect and Impurity-Engineered Semiconductors and Devices , 1995 , 609
Copyright
Copyright © Materials Research Society 1995

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References

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