Published online by Cambridge University Press: 21 February 2011
We present a computer simulation of the problem of competitive crystal growth of one-dimensional and two-dimensional single crystals restricted to a two-dimensional space. Two similar competition indexes ξ and χ accounting for the degree of preferred orientation developped during the growth process are defined and we show that they varies linearly with the film thickness. The existence of a clear formal similarity between ξ and χ indexes defined in the direct space with a textural index τ defined in the reciprocal space permits the identification of a competitive growth process by X-ray diffraction.