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Origins of Twinned Microstructures in B12As2 Epilayers Grown on (0001) 6H-SiC and Their Influence on Physical Properties

Published online by Cambridge University Press:  31 January 2011

Yu Zhang
Affiliation:
[email protected], Stony Brook University, Department of Materials Science and Engineering, Stony Brook, New York, United States
Hui Chen
Affiliation:
[email protected], Stony Brook University, Department of Materials Science and Engineering, Stony Brook, New York, United States
Ning Zhang
Affiliation:
[email protected], Stony Brook University, Department of Materials Science and Engineering, Stony Brook, New York, United States
Michael Dudley
Affiliation:
[email protected], Stony Brook University, Department of Materials Science and Engineering, Stony Brook, New York, United States
Yinyan Gong
Affiliation:
[email protected], University of Bristol, H.H. Wills Physics Laboratory, Bristol, United Kingdom
Martin Kuball
Affiliation:
[email protected], University of Bristol, H.H. Wills Physics Laboratory, Bristol, United Kingdom
Zhou Xu
Affiliation:
[email protected], Kansas State University, Department of Chemical Engineering, Manhattan, Kansas, United States
Yi Zhang
Affiliation:
[email protected], Kansas State University, Department of Chemical Engineering, Manhattan, Kansas, United States
James Edgar
Affiliation:
[email protected], Kansas State University, Department of Chemical Engineering, Manhattan, Kansas, United States
Lihua Zhang
Affiliation:
[email protected], Brookhaven National Laboratory, Center for Functional Materials, Upton, New York, United States
Yimei Zhu
Affiliation:
[email protected], Brookhaven National Laboratory, Center for Functional Materials, Upton, New York, United States
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Abstract

The defect structure in B12As2 epitaxial layers grown at two different temperatures on (0001) 6H-SiC by chemical vapor deposition (CVD) was studied using synchrotron white beam x-ray topography (SWBXT) and high resolution transmission electron microscopy (HRTEM). The observed differences in microstructures were correlated with the differences in nucleation at the two growth temperatures. The effect of the difference in microstructure on macroscopic properties of the B12As2 was illustrated using the example of thermal conductivity which was measured using the 3-ω technique. The relationship between the measured thermal conductivity and observed microstructures is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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References

1. Emin, D. Physics Today, 55, January (1987).Google Scholar
2. Emin, D. J. Sol. Sta. Chem., 179, 2791 (2006).Google Scholar
3. Emin, D. Aselage, T. L., J. App. Phys., 97, 013529 (2005).Google Scholar
4. Emin, D. J. Sol. Sta. Chem., 177, 1619 (2004).Google Scholar
5. Carrard, M. Emin, D. Zuppiroli, L. Phys. Rev., B 51(17), 11270 (1995).Google Scholar
6. Aselage, T.L. and Emin, D. Carbides, Boron, in CRC Handbook of Thermoelectrics, Rowe, D.M. (Ed.), CRC Press, Boca Raton, (1995).Google Scholar
7. Nagarajan, R. Xu, Z. Edgar, J. H., Baig, F. Chaudhuri, J. Rek, Z. Payzant, E. A., Meyer, H. M., Pomeroy, J. and Kuball, M. J. Crystal Growth., 273, 431 (2005).Google Scholar
8. Cahill, and Pohl, , Phys. Rev., B 35, 4067 (1987)Google Scholar
9. Cahill, et al., Rhys. Rev., B 50, 6077 (1994)Google Scholar
10. Chan, S. W., J. Phys. Chem., Solids 55, 1137 (1994).Google Scholar
11. Flynn, C. P. and Eades, J. A., Thin Solid Films, 389, 116 (2001).Google Scholar
12. Chen, H. Wang, G. Dudley, M. Zhang, L. Wu, L. Zhu, Y. Xu, Z. Edgar, J. H., and Kuball, M. J. Appl. Phys., 103 (12), 123508 (2008)Google Scholar
13. Chen, Hui, Wang, Guan, Dudley, Michael, Xu, Zhou, Edgar, J. H., Batten, Tim, Kuball, Martin, Zhang, Lihua, and Zhu, Yimei, Appl. Phys. Lett., 92 (23), 231917 (2008)Google Scholar
14. Otero, Roberto, Hümmelink, Frauke, Sato, Fernando, Legoas, Sergio B. Thostrup, Peter, Lægsgaard, Erik, Stensgaard, Ivan, Galvão, Douglas S. and Besenbacher, Flemming, Nature Materials, 3, 779782 (2004)Google Scholar
15. Borca-Tasciuc, T. et al. , Review of Scientific Instruments, 72, 2139 (2001)Google Scholar
16. Gong, Y. Gary, J. Chen, H. Zhang, Yu, Dudley, M. Zhang, Yi, Edgar, J. and Kuball, M. (unpublished).Google Scholar