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Optical, Structural, and Electrical Properties of Vanadium Dioxide Grown on Sapphire Substrates with Different Crystallographic Orientations
Published online by Cambridge University Press: 11 December 2012
Abstract
The phase transition of VO2 grown on sapphire having different crystallographic growth planes is examined experimentally. Measurements of electrical resistivity are compared with spectroscopic ellipsometry studies, to obtain complex index of refraction and plasma frequency, and transmission in the terahertz frequency range, each as a function of temperature.
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- MRS Online Proceedings Library (OPL) , Volume 1494: Symposium Z – Oxide Semiconductors and Thin Films , 2013 , pp. 239 - 244
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- Copyright © Materials Research Society 2012