No CrossRef data available.
Article contents
Optical Property Characterization of Silicon Quantum Wires
Published online by Cambridge University Press: 10 February 2011
Abstract
The recent success of bulk synthesis of pure nano-scale silicon quantum wires (SiQW's) enables us to evaluate their photoluminescence (PL) characteristics under ultra-violet photoexcitation. Intense multiple light emissions ranging from dark red to blue regions were revealed for as-grown and partially oxidized SiQW samples. The physical origin of the multiemissions is discussed on the basis of quantum confinements, or defect centers.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 2000
References
REFERENCES
2.
Cullis, A. G., Canham, L. T., and Calcott, P. J., J. Appl. Phys.
82, 909 (1997).10.1063/1.366536Google Scholar
4.
Deck, P., Rosenbauer, M., Stuntzmann, M., Weber, J., and Brandt, M., Phys. Rev. Letters
69, 2531 (1992).10.1103/PhysRevLett.69.2531Google Scholar
7.
Morales, M., and Lieber, C. M., Science
279, 208 (1998).10.1126/science.279.5348.208Google Scholar
8.
Yu, D. P.
Bai, Z. G., Ding, Y., Hang, Q.L., Zhang, H.Z., Wang, J.J., Zou, Y.H., Qian, W., Zhou, H.T., Xiong, G.C., and Feng, S.Q.
Appl. Phys. Letters
72, 3458 (1998).10.1063/1.121665Google Scholar
10.
Buda, F., Kohanoff, J., and Parrinello, M., Phys. Rev. Letters
69, 1272 (1992).10.1103/PhysRevLett.69.1272Google Scholar
11.
Read, A. J., Needs, R. J., Nash, K. J., Canham, L. T., P. Calcott, D. J., and Qteish, A., Phys. Rev. Letters
69, 1232 (1992).10.1103/PhysRevLett.69.1232Google Scholar
12.
Ohno, T., Shiraish, K., and Ogawa, T., Phys. Rev. Letters
69, 2400 (1992).10.1103/PhysRevLett.69.2400Google Scholar
13.
Sanders, G. D., and Chang, Y. C., Phys. Rev. B
45, 9202 (1992).10.1103/PhysRevB.45.9202Google Scholar
14.
Delley, B., and Steigmeier, E. F., Phys. Rev. B
47, 1397 (1993).10.1103/PhysRevB.47.1397Google Scholar
15.
Bentosela, F., Exner, P., and Zagrebnov, V. A., Phys. Rev. B
57, 1382 (1998).10.1103/PhysRevB.57.1382Google Scholar
16.
Filonov, A. B., Kholod, A. N., Borisenko, V. E., Pushkarchuk, A. L., Zelenkovskii, V. M., Bassani, F., and D'Avitaya, F. A., Phys. Rev. B
57, 1394 (1998).10.1103/PhysRevB.57.1394Google Scholar
17.
Schuppler, S., Friedman, S. L., Marcus, M. A., Adler, D. L., Xie, Y. H., Ross, F. M., Harris, T. D., Brown, W. L., Chabal, Y. J., Brus, L. E., and Citrin, P. H., Phys. Rev. letters
72, 2648 (1994).10.1103/PhysRevLett.72.2648Google Scholar
18.
Mason, D.
Credo, G. M., Weston, K. D., and Buratto, S. K., Phys. Rev. Letters
80, 5405(1998).10.1103/PhysRevLett.80.5405Google Scholar
19.
Yu, D.P., Hang, Q.L., Ding, Y., Zhang, H.Z., Bai, Z.G., Wang, J.J., Zou, Y.H., Qian, W., Xiong, G.C. and Feng, S.Q., Appl. Phys. Letters
73, 3076 (1998).10.1063/1.122677Google Scholar