Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-19T03:01:37.495Z Has data issue: false hasContentIssue false

On the Origin of EL2 Intracenter Absorption Band in GaAs

Published online by Cambridge University Press:  26 February 2011

M. Skowronski*
Affiliation:
Cabot Corporation, Concord Road, Billerica, Massachusetts, 01821
Get access

Abstract

An alternative interpretation of optical absorption spectra due to intracenter transition within EL2 defect in GaAs is provided. The arguments are presented that states originating from the L-valley of the conduction band can account for the presence of the wide absorption band, the no-phonon line and the observed uniaxial stress splittings. Using the analogy to the DX center, this model presents an explanation for the existence of the metastable state of EL2.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. T. N. Theis Defects in Semiconductors ed. Bardeleben, H. J. von Materials Science Forum 10–12 p.393 (1986)Google Scholar
2.Morgan, T. N.Phys. Rev. B 34, 2664 (1986)Google Scholar
3.Mizuta, M., Tachikawa, M., Kukimoto, H. and Minomura, S.Jpn. J. Appl. Phys. 24, L143 (1985)Google Scholar
4.Kaminska, M., Skowronski, M., and Kuszko, W.Phys. Rev. Lett. 55, 2204, (1985)Google Scholar
5.Kaminska, M., Skowronski, M., Lagowski, J., Parsey, J. M., and Gatos, H. C.Appl. Phys. Lett. 43, 302 (1983)Google Scholar
6.Martin, G. M.Appl. Phys. Lett. 39, 747 (1981)Google Scholar
7.Chantre, A., Vincent, G., and Bois, D.Phys. Rev. B 23. 5335 (1981)Google Scholar
8.Noras, J. M. and Allen, J. W.J. Phys. C 13, 3511 (1980)Google Scholar
9.Juhl, A. and Bimberg, D.Semi-insulating III-V Materials, ed. Kukimoto, H. and Miyazawa, S. (1986 Ohmsha Ltd.) p. 477Google Scholar
10.Morgan, T. N., Welber, B., and Bhargava, R. N.Phys. Rev. 166, 751 (1968)Google Scholar
11.Henry, C. H., Dean, P. J., and Cuthbert, J. D.Phys. Rev. 166, 754 (1968)Google Scholar
12.Shanabrook, B. V., Klein, P. B., Swiggard, E. M. and Bishop, S. G.J. Appl. Phys. 54 336 (1983)Google Scholar
13.Tajima, M. Defects in Semiconductors ed. Bardeleben, H. J. von Materials Science Forum 10–12 (1986) p. 493Google Scholar
14.Bassani, F., Iadonisi, G., and Preziosi, B.Phys. Rev. 186, 735 (1969)Google Scholar
15.Aspnes, D. E., Olson, C. G., and Lynch, D. W.Phys. Rev. Lett. 37, 766 (1976)Google Scholar
16.Skowronski, M., Lagowski, J., and Gatos, H. C.J. Appl. Phys. 59, 2451 (1986)Google Scholar
17.Samuelson, L. and Omling, P.Phys. Rev. B 34, 5603 (1986)Google Scholar
18.for review see Kennedy, T. A. Defects in Semiconductors ed. Bardeleben, H. J. von Materials Science Forum 10–12, 283 (1986)Google Scholar
19.Skowronski, M., Lagowski, J., and Gatos, H. C.Phys. Rev. B 32, 4264 (1985)Google Scholar