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OMVPE Growth of Materials for Red Laser Diodes

Published online by Cambridge University Press:  21 February 2011

D. P. Bour
Affiliation:
Electronic Materials Laboratory, XEROX Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, CA 94304
D. W. Treat
Affiliation:
Electronic Materials Laboratory, XEROX Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, CA 94304
R. D. Bringans
Affiliation:
Electronic Materials Laboratory, XEROX Palo Alto Research Center, 3333 Coyote Hill Road, Palo Alto, CA 94304
R. S. Geels
Affiliation:
SDL, Inc., 80 Rose Orchard Way, San Jose, CA 95134
D. F. Welch
Affiliation:
SDL, Inc., 80 Rose Orchard Way, San Jose, CA 95134
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Abstract

The properties and low pressure organometallic vapor phase epitaxy of Gaxln1-xP/(AIGa)0.5ln0.5P quantum well (QW) laser diode heterostructures with Al0.5ln0.5P cladding layers, and having wavelength 614<λ<690 nm, are described. At longer wavelengths (λ>660 nm), threshold current densities under 200 A/cm2 and efficiencies greater than 75% result from a biaxially-compressed GalnP QW active region. Although short wavelength laser performance is diminished by the poor electron confinement afforded by AIGalnP heterostructures, good 630 nm band performance, and extension into the 610 nm band, is achieved with strained, single QW active regions.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

1 Kobayashi, K., Kawata, S., Gomyo, A., Hino, I., and Hino, I. Suzuki, T., Electronics Letts. 21,931 (1985).Google Scholar
2 Ikeda, M., Mori, Y., Sato, H., Kaneko, K., and Watanabe, N., Appl. Phys. Letts. 47,1027(1985).Google Scholar
3 Ishikawa, M., Ohba, Y., Sugawara, H., Yamamoto, M., and Nakanisi, T., Appl. Phys. Letts. 48, 207 (1986).Google Scholar
4 Hatakoshi, G., Itaya, K., Ishikawa, M., Okajima, M., and Uematsu, Y., IEEE Jour. Quantum Electronics 27,1476(1991).Google Scholar
5 Ishikawa, M., Shiozawa, H., Itaya, K., Hatakoshi, G., and Uematsu, Y., IEEE Jour. Quantum Electronics 27, 23 (1991).Google Scholar
6 Valster, A., van der Poel, C. J., Finke, M. N., and Boermans, M. J. B., Electronics Letts. 28,144 (1992).Google Scholar
7 Hamada, H., Tominaga, K., Shono, M., Honda, S., Yodoshi, K., and Yamaguchi, T., Electronics Letts. 28,1834 (1992).Google Scholar
8 Geels, R. S., Welch, D. F., Scifres, D. R., Bour, D. P., Treat, D. W., and Bringans, R. D., Electronics Letts. 28,1810(1992).Google Scholar
9 Hamada, H., Hiroyama, R., Honda, S., Shono, M., Yodoshi, K., and Yamaguchi, T., IEEE Jour. Quantum Electronics 29,1844(1993).Google Scholar
10 Rennie, J., Okajima, M., Watanabe, M., and Hatakoshi, G., IEEE Jour. Quantum Electronics 29,1857(1993).Google Scholar
11 Valster, A., van der Poel, C. J., Finke, M. N., and Boermans, M. J. B., 13th IEEE Int. Semiconductor Laser Conf. Digest 13,152(1992).Google Scholar
12 Valster, A., Brouwer, A., Chang, C. V. J., van der Poel, C. J., Conference on Lasers and Electro-Optics (CLEO) Technical Digest 11,476 (1993).Google Scholar
13 Bour, D. P., Treat, D. W., Thornton, R. L., Paoli, T. L., Bringans, R. D., Krusor, B. S., Geels, R. S., Welch, D. F., and Wang, T. Y., Jour. Crystal Growth 124, 751 (1992).Google Scholar
14 Casey, H. C. Jr. and Panish, M. B., Heterostructure Lasers Part B: Materials and Operating Characteristics. (Academic Press, Orlando, FL, 1978).Google Scholar
15 Ohba, Y., Nishikawa, Y., Nozaki, C., Sugawara, H., and Nakanisi, T., Jour. Crystal Growth 93, 613(1988).Google Scholar
16 Hino, I., Gomyo, A., Kawata, S., Kobayashi, K., and T.Suzuki, , Inst. Phys. Conf. Series. 79, New York: (Adam Hilger Ltd., New York, 1985) p. 151.Google Scholar
17 Yokotsuka, T., Takamori, A., and Nakajima, M., Appl. Phys. Letts. 58, 1521 (1991).Google Scholar
18 Liedenbaum, C. T. F. H., Valster, A., Severens, A. L. G. J., and 't Hooft, G. W., Appl. Phys. Letts. 57, 2698 (1990).Google Scholar
19 Gomyo, A., Suzuki, T., Kobayashi, K., Kawata, S., Hino, I., and Yuasa, T., Appl. Phys. Letts. 50,673(1987).Google Scholar
20 Tanaka, T., Minagawa, S., Kawano, T., and Kajimura, T., Electronics Letts. 25, 905(1989).Google Scholar
21 Hamada, H., Shono, M., Honda, S., Hiroyama, R., Yodoshi, K., and Yamaguchi, T., IEEE Jour. Quantum Electronics 27, 1483(1991).Google Scholar
22 Ishikawa, M., Ohba, Y., Watanabe, Y., Nagasak, H., Sugawara, H., Yamamoto, M., and Hatakoshi, G., Ext. Absts. 18th Int. Conf. on Solid State Devices and Materials, pp. 153156, Tokyo (1986).Google Scholar
23 Furuya, A., Kito, Y., Fukushima, T., Sugano, M., Sudo, H., Anayama, C., Kondo, M., and Tanahashi, T., IEEE Jour. Quantum Electronics 29, 1869 (1993).Google Scholar