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Observation of Retarded Recombination in ChargeSeparation Structures

Published online by Cambridge University Press:  01 February 2011

R. K. Ahrenkiel ,
D. Friedman ,
W. K. Metzger ,
M. Page  and
J. Dashdorj
R. K. Ahrenkiel
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
D. Friedman
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
W. K. Metzger
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
J. Dashdorj
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
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Abstract

Measurement of recombination and minority-carrier lifetimes has become a very common activity in current semiconductor technology. The two primary measurement techniques are based on photoconductive decay (PCD) and time-resolved photoluminescence (TRPL). The measurement of the “true” lifetime depends on the carriers being confined to a given spatial region of a diagnostic device. When internal electric fields exist that separate the charges, the measured value does not represent the real minority-carrier lifetime. In these cases, the measured quantity is a function of the true lifetime and the measurement technique.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 799: Symposium Z – Progress in Compound Semiconductor Materials III - Electronic and Optoelectronic Applications , 2003 , Z4.6
Copyright
Copyright © Materials Research Society 2004

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References

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