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Observation of Heteroepitaxially Grown Organic Ultrathin Layers on Inorganic Substrates by In Situ RHEED and by STM

Published online by Cambridge University Press:  25 February 2011

Masahiko Hara ,
Hiroyuki Sasabe ,
Akira Yamada  and
Anthony F. Garito
Masahiko Hara
Affiliation:
Frontier Research Program, The Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351–01, JAPAN
Hiroyuki Sasabe
Affiliation:
Frontier Research Program, The Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351–01, JAPAN
Akira Yamada
Affiliation:
Frontier Research Program, The Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351–01, JAPAN
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Abstract

An organic molecular beam epitaxy (OMBE) system has been designed and constructed with in situ reflection high-energy electron diffraction (RHEED) specifically for the deposition of organic molefelar layers under ultrahigh vacuum (UHV), the order of 10–10 torr. The system is equipped with a portable UHV chamber which allows easy transfer of the OMBE film samples to a separate UHV scanning tunneling microscopy (STM) system. A structural investigation of heteroepitaxially grown organic ultrathin layers of copper phthalocyanine (CuPc) on inorganic substrates was carried out by the combined UHV system from less than a monolayer of CuPc.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 159: Symposium C – Atomic Scale Structure of Interfaces , 1989 , 57
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

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