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Oblique Stacking of Three-Dimensional Dome Islands in Ge/Si Multilayers

Published online by Cambridge University Press:  17 March 2011

P. Sutter
Affiliation:
Department of Physics, Colorado School of Mines, Golden, CO 80401, USA
E. Sutter
Affiliation:
Department of Physics, Colorado School of Mines, Golden, CO 80401, USA
L. Vescan
Affiliation:
Institut für Schicht & Ionentechnik, Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany
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Abstract

The organization of Ge ‘dome’ islands in Ge/Si multilayers has been investigated by cross-sectional transmission electron microscopy. Ge ‘domes’ are found to spontaneously arrange in oblique stacks, replicating at a well-defined angle from one bilayer to the next. The formation of oblique island stacks is governed by a complex interplay of surface strain - generated by the already buried islands - and surface curvature - caused by the inherent tendency of large ‘domes’ to carve out material from the surrounding planar substrate.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

1 Hu, X. and Sarma, S Das, Phys. Rev. A 61, 62301–1 (2000).Google Scholar
2 Reed, M.A., Scientific American 268, 118 (1993).Google Scholar
3 Micic, O.I.et al. J. Phys. Chem. 98, 4966 (1994).Google Scholar
4 Xie, Q., Madhukar, A., Chen, P., and Kobayashi, N., Phys.Rev.Lett. 75, 2542 (1995).Google Scholar
5 Mo, Y.-W., Savage, D.E., Swartzentruber, B.S., and Lagally, M.G., Phys. Rev. Lett. 65, 1020 (1990).Google Scholar
6 Medeiros-Ribeiro, G., Bratkovski, A.M., Kamins, T.I., Ohlberg, D.A.A., and Williams, R.S., Science 279, 353 (1998).Google Scholar
7 Tersoff, J., Teichert, C., and Lagally, M.G., Phys.Rev.Lett. 76, 1675 (1996).Google Scholar
8 Mateeva, E., Sutter, P., Bean, J.C., and Lagally, M.G., Appl. Phys. Lett. 71, 3233 (1997).Google Scholar
9 Vescan, L., Jäger, W., Dieker, C., Schmidt, K., Hartmann, A., and Lüth, H., MRS Symp. Proc. 263, 23 (1992).Google Scholar
10 Mateeva, E., Sutter, P., and Lagally, M.G., Appl. Phys. Lett. 74, 567 (1999).Google Scholar
11 Sutter, P. and Lagally, M.G., Phys. Rev. Lett. 81, 3471 (1998).Google Scholar
12 Ross, F.M., Tersoff, J., and Tromp, R.M., Phys. Rev. Lett. 80, 984 (1998).Google Scholar