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Novel Electrical Conduction of Insulators under Examination of Defects and Injection and Relationship to Theories of Ferroelectric Domains

Published online by Cambridge University Press:  14 July 2014

Y. Watanabe ,
Y. Urakami ,
D. Matsumoto ,
S. Kaku ,
S.-W. Cheong ,
G. A. Thomas  and
S. Miyauchi
Y. Watanabe
Affiliation:
Kyushu University, Fukuoka 812-8581, Japan
Y. Urakami
Affiliation:
Kyushu University, Fukuoka 812-8581, Japan Hitachi Central lab., Kokubunji 185-0014, Japan
D. Matsumoto
Affiliation:
Kyushu University, Fukuoka 812-8581, Japan Hitachi Central lab., Kokubunji 185-0014, Japan
S. Kaku
Affiliation:
Kyushu University, Fukuoka 812-8581, Japan Tokyo Institute of Technology, Tokyo 152-8551, Japan
S.-W. Cheong
Affiliation:
Rutgers University, Piscataway, NJ 08854, USA
G. A. Thomas
Affiliation:
New Jersey Institute of Technology, Newark, NJ 07102, USA
S. Miyauchi
Affiliation:
Kyushu University, Fukuoka 812-8581, Japan Murata Co., Izumo 699-0696, Japan
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Abstract

Electrical conductions in insulators such as resistance switching, conduction at interfaces, and conduction at domain boundaries and free surface of ferroelectrics are of interest. These conductions are often attributed to novel mechanism such as ferroelectric polarization. On the other hand, these interpretations appear not fully accepted, because the recent advanced theories of ferroelectric domains disregard screening indicated by these conduction phenomena. That is, these conduction phenomena are quietly regarded as the classical conduction originating from defects. In this paper, we examine these conductions in pure wide bandgap insulators in view of defects, using the direct-accessibility (tangibility) of conduction at free surfaces. Although most of these conductions in ferroelectrics may not be useful in large-scale applications, we show that they have fundamental implications on renovations of ferroelectric basics.

Keywords

ferroelectricelectrical propertiesdefects
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1674: Symposium J – Physics of Oxide Thin Films and Heterostructures , 2014 , mrss14-1674-j02-06
Copyright
Copyright © Materials Research Society 2014 

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References

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