Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-27T02:40:58.835Z Has data issue: false hasContentIssue false

Novel Approach for High Resolution Tem Studies of Ceramic-Ceramic Interfaces

Published online by Cambridge University Press:  22 February 2011

Abhaya K. Datye
Affiliation:
Departments of Chemical Engineering and Chemistry and the Center for Microengineered Ceramics, University of New Mexico, Albuquerque, NM 87131
Robert T. Paine
Affiliation:
Departments of Chemical Engineering and Chemistry and the Center for Microengineered Ceramics, University of New Mexico, Albuquerque, NM 87131
Chaitanya K. Narula
Affiliation:
Departments of Chemical Engineering and Chemistry and the Center for Microengineered Ceramics, University of New Mexico, Albuquerque, NM 87131 Ford Motor Company Research Laboratories, Dearborn, MI 48121-2063.
Lawrence F. Allard
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Lab., P.O. Box 2008, Oak Ridge, TN 37831
Get access

Abstract

Ceramic coatings on oxides can be studied by high resolution transmission electron microscopy (HRTEM), with minimal sample preparation, if the substrate consists of nonporous particles of simple geometric shape. Interfaces suitable for ‘end-on’ examination by HRTEM can be readily obtained without any necessity for ion-beam thinning. All the interface orientations that are thermodynamically stable are available for examination from a single sample. This technique is of general applicability and can be used for studies of metal-ceramic and ceramic-ceramic interfaces. We have examined the nature of boron nitride interfaces with oxides such as MgO, TiO2 and Al2O3 and find that BN appears to wet the oxide surface and form tough, adherent coatings. The hexagonal crystalline BN grows with the (0001) planes always being locally parallel to the oxide surface in every instance.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Krivanek, O. L. (Ed.), ‘Atomic Structure and Properties of Interfaces’, Proc. of a workshop held at Wickenburg, AZ; published as Ultramicroscopy, 14 (1986).Google Scholar
2. Spence, J. C. H., ‘Experimental High Resolution Electron Microscopy’, p 88, Oxford Univ. Press, 1981.Google Scholar
3. Withers, P. J., Stobbs, W. M. and Bourdillion, A. J., J. Microscopy, 151, 159 (1988).Google Scholar
4. Datye, A. K. and Long, N. J., Ultramicroscopy, 25, 203 (1988).Google Scholar
5. Datye, A. K., Logan, A. D. and Long, N. J., J. Catalysis, 109, 76 (1988).Google Scholar
6. Logan, A. D., Braunschweig, E. J., Datye, A. K. and Smith, D. J., Langmuir, 4, 827 (1988).Google Scholar
7. Vacha, L. J. B., Moynihan, C. T., Harbison, B. B., Cadien, K., Mossadegh, R., Mater. Sci. Forum, 19-20 (Halide Glasses, Pt. 1), 343 (1987).Google Scholar
8. Hodes, E., Goerke, K., Ger. Offen., DE 3,602,104, 30 Jul 1987.Google Scholar
9. Singh, R. N. and Brun, M. K., Adv. Ceram. Mater., 3, 235 (1987).Google Scholar
10. Paine, R. T., Narula, C. K., Schaeffer, R. E. and Datye, A. K., submitted to J. Am. Chem. Soc.Google Scholar
11. Jones, C. F., Segall, R. L., Smart, R. St. C., Tumer, P. S., Phil. Mag., A 42, 267 (1969).Google Scholar
12. Uyeda, R., J. Cryst. Growth, 24/25, 69 (1974).Google Scholar
13. lijima, S., Jap. J. Appl. Phys., 23, L347 (1984).Google Scholar
14. Narula, C. K., Paine, R. T., Schaeffer, R. E., Datye, A. K. and Hammetter, W. F., J. Am. Chem. Soc., 109, 5556 (1987).Google Scholar