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Non-Local Hall Resistance in FePt / Au Multi-Terminal Devices

Published online by Cambridge University Press:  02 August 2012

Koki Takanashi ,
Shun Shibata ,
Isamu Sugai  and
Takeshi Seki
Koki Takanashi
Affiliation:
Insititute for Materials Research, Tohoku University, Sendai 980-8577, Japan
Shun Shibata
Affiliation:
Insititute for Materials Research, Tohoku University, Sendai 980-8577, Japan
Isamu Sugai
Affiliation:
Insititute for Materials Research, Tohoku University, Sendai 980-8577, Japan
Takeshi Seki
Affiliation:
Insititute for Materials Research, Tohoku University, Sendai 980-8577, Japan
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Abstract

In order to understand the electric current distribution in a non-local geometry, the geometrical dependence of non-local Hall resistance was investigated for lateral devices consisting of an FePt perpendicular spin polarizer and a Au Hall cross. The finite element simulation was also carried out to calculate the electric potential in the devices. The experiment and the simulation indicated that non-local Hall resistance included the contribution of anomalous Hall effect (AHE) in the FePt perpendicular spin polarizer. The resistance change due to AHE in FePt became remarkable for devices with a wide electrode. Taking into account the contribution of AHE, the spin Hall angle was estimated to be 0.05 for the device with a narrow Au electrode.

Keywords

spintronicmagnetic propertiesHall effect
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1458: Symposium LL – New Trends and Developments in Nanomagnetism , 2012 , mrss12-1458-ll13-01
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

1. Dyakonov, M. I. and Perel, V. I., Phys. Lett., 35A, 459 (1971).10.1016/0375-9601(71)90196-4Google Scholar
2. Hirsch, J. E., Phys. Rev. Lett., 83, 1834 (1999).10.1103/PhysRevLett.83.1834Google Scholar
3. Zhang, S., Phys. Rev. Lett., 85, 393 (2000).10.1103/PhysRevLett.85.393Google Scholar
4. Murakami, S., Nagaosa, N., and Zhang, S., Science, 301, 1348 (2003).10.1126/science.1087128Google Scholar
5. Valenzuela, S. O. and Tinkham, M., Nature 442, 176 (2006).10.1038/nature04937Google Scholar
6. Saitoh, E., Ueda, M., Miyajima, H., and Tatara, G., Appl. Phys. Lett., 88, 182509 (2006).10.1063/1.2199473Google Scholar
7. Kimura, T., Otani, Y., Sato, T., Takahashi, S., and Maekawa, S., Phys. Rev. Lett., 98, 156601 (2007).10.1103/PhysRevLett.98.156601Google Scholar
8. Seki, T., Hasegawa, Y., Mitani, S., Takahashi, S., Imamura, H., Maekawa, S., Nitta, J., and Takanashi, K., Nature Mater., 7, 125 (2008).10.1038/nmat2098Google Scholar
9. Mosendz, O., Pearson, J. E., Fradin, F. Y., Bauer, G. E. W., Bader, S. D., and Hoffmann, A., Phys. Rev. Lett., 104, 046601 (2010).10.1103/PhysRevLett.104.046601Google Scholar
10. Morota, M., Niimi, Y., Ohnishi, K., Wei, D. H., Tanaka, T., Kontani, H., Kimura, T., and Otani, Y., Phys. Rev. B, 83, 174405 (2011).10.1103/PhysRevB.83.174405Google Scholar
11. Liu, L., Moriyama, T., Ralph, D. C., and Buhrman, R. A., Phys. Rev. Lett., 106, 036601 (2011).10.1103/PhysRevLett.106.036601Google Scholar
12. Niimi, Y., Morota, M., Wei, D. H., Deranlot, C., Basletic, M., Hamzic, A., Fert, A., and Otani, Y., Phys. Rev. Lett., 106, 126601 (2011).10.1103/PhysRevLett.106.126601Google Scholar
13. Guo, G. Y., Maekawa, S., and Nagaosa, N., Phys. Rev. Lett., 102, 036401 (2009).10.1103/PhysRevLett.102.036401Google Scholar
14. Gradhand, M., Fedorov, D. V., Zahn, P., and Mertig, I., Phys. Rev. B, 81, 245109 (2010).10.1103/PhysRevB.81.245109Google Scholar
15. Sugai, I., Mitani, S., and Takanashi, K., IEEE Trans. Magn., 46, 2559 (2010).10.1109/TMAG.2010.2044889Google Scholar
16. Gu, B., Sugai, I., Ziman, T., Guo, G. Y., Nagaosa, N., Seki, T., Takanashi, K., and Maekawa, S., Phys. Rev. Lett., 105, 216401 (2010).10.1103/PhysRevLett.105.216401Google Scholar
17. Takahashi, S. and Maekawa, S., Phys. Rev. B, 67, 052409 (2003).10.1103/PhysRevB.67.052409Google Scholar