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Nonlinear Optics And Surface Science

Published online by Cambridge University Press:  26 February 2011

Y. R. Shen
Y. R. Shen*
Affiliation:
Department of Physics, University of California, Berkeley, California and Materials and Molecular Research Division, Lawrence Berkeley Laboratory, Berkeley, California 94720
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Abstract

The recent status of applications of nonlinear optics to surface science is reviewed. The basic theory of wave mixing on a surface layer, and the possibility of using various nonlinear optical processes for surface probing are briefly discussed. Emphasis is on surface second harmonic generation, which is shown with many illustrations to be a rather unique and versatile tool for surface studies.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 51: Symposium A – Beam-Solid Interactions and Phase Transformations , 1985 , 39
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1.See, for example, Surface Studies with Lasers, eds. Aussenegg, F. R., Leitner, A., and Lippitsch, M. E. (Springer-Verlag, Berlin, 1983); papers presented in Topical Meeting on Microphysics on Surfaces, Beams, 49 and Adsorbates (Santa Fe, February, 1985) (to be published in J. Vac. Sci. Techn. B).CrossRefGoogle Scholar
2. Trager, F., Coufal, H., and Chuang, T. J., Phys. Rev. Lett. 49, 1720 (1982).CrossRefGoogle Scholar
3. Boccara, A. C., Fournier, D., and Badoz, J., Appl. Phys. Lett. 36, 130 (1980); M. A. Olmstead and N. M. Amer, Phys. Rev. Lett. 52, TT148 (1984).CrossRefGoogle Scholar
4. Chuang, T. J. and Seki, H., Phys. Rev. Lett. 49, 382 (1982).CrossRefGoogle Scholar
5.See, for example, Zacharias, H., Loy, M. M. T., and Roland, P. A., Phys. Rev. Lett. 49, 1790 (1982); J. Haeger, Y. R. Shen, and H. Walther, Phys. Rev. A 31, 1962 (1984); and references therein.CrossRefGoogle Scholar
6. Brown, F., Parks, R. E., and Sleeper, A. M., Phys. Rev. Lett. 14, 1029 (1965); N. Bloembergen, R. K. Chang, and C. H. Lee, Phys. Rev. Lett. 16, 986 (1966); N. Bloembergen, R. K. Chang, S. S. Jha, and C. H. Lee, Phys. Rev. 174, 813 (1968); C. C. Wang and A. N. Duminski, Phys. Rev. Lett. 20, 6-F (1968); F. Brown and R. E. Parks, Phys. Rev. Lett. 16, 507 (19-6); J. M. Chen, J. R. Bower, C. S. Wang, and C. H. Lee, OpTics Commun. 9, 132 (1973).CrossRefGoogle Scholar
7.See, for example, Heinz, T. F., Tom, H. W. K., and Shen, Y. R., Laser Focus 19, 101 (1983).Google Scholar
8.See, for example, Shen, Y. R., The Principles of Nonlinear Optics (J. Wiley, New York, 1984), Chapter 15.Google Scholar
9. Guyot-Sionnest, P., Chen, W., and Shen, Y. R. (to be published).Google Scholar
10. Bloembergen, N., Chang, R. K., Jha, S. S., and Lee, C. H., Phys. Rev. 174, 813 (1968); C. C. Wang, Phys. Rev. 178, 1457 (1969).CrossRefGoogle Scholar
11. Shen, Y. R., The Principles of Nonlinear Optics (J. Wiley, New York, 1984), Chapter 25.Google Scholar
12. Chen, C. K., Castro, A. R. B. de, Shen, Y. R., and DeMartini, F., Phys. Rev. Lett. 43, 946 (1979).CrossRefGoogle Scholar
13. Hetheringon, W. M., Wyck, N. E. Van, Koenig, E. W., Stegeman, G. I., and Fortenberry, R. M., Optics Lett. 9, 89 (1984); J. Chem. Phys. (to be published).Google Scholar
14. Heritage, J. P. and Allara, D. L., Chem. Phys. Lett. 74, 507 (1980).CrossRefGoogle Scholar
15. Boyd, G. T., Shen, Y. R., and Hansch, T. W. (submitted to Optics Lett.)Google Scholar
16. Heinz, T. F., Loy, M. M. T., and Thompson, W. A., Phys. Rev. Lett. 54, 63 (1985).CrossRefGoogle Scholar
17. Shang, C. V., Yen, R., and Hirlimann, C., Phys. Rev. Lett. 51, 900 (1983); S. A. Akhmanov, N. I. Koroteev, G. A. Paitian, I. L. Shumay, M. F. Galjautdinov, I. B. Khaibullin, and E. I. Shtyrkov, Optics Commun. 47, 202 (1983); J. Opt. Soc. Am. B 2, 283 (1985); A. M. Malvezzi, J. M. Lire, and N. Bloembergen, Appl. Phys. Lett. 45, 1019 (1984).CrossRefGoogle Scholar
18. Tom, H. W. K., Mate, C. M., Zhu, X. D., Crowell, J. E., Heinz, T. F., Somorjai, G., and Shen, Y. R., Phys. Rev. Lett. 52, 348 (1984).CrossRefGoogle Scholar
19. Zhu, X. D., Carr, R., and Shen, Y. R., Surf. Sci. (to be published).Google Scholar
20. Tom, H. W. K., Zhu, X. D., Shen, Y. R., and Somorjai, G. A., Proc. XVII Internatl. Conf. on Physics of Semiconductors (Springer-Verlag, Berlin, 1984), p.99; T. F. Heinz, M. M. T. Loy, and W. A. Thompson, J. Vac. Soc. Tech. (to be published).Google Scholar
21. Heinz, T. F., Chen, C. K., Ricard, D., and Shen, Y. R., Phys. Rev. Lett. 48, 478 (1982).CrossRefGoogle Scholar
22. Heinz, T. F., Tom, H. W. K., and Shen, Y. R., Phys. Rev. A 28, 1883 (1983).CrossRefGoogle Scholar
23. Rasing, Th., Shen, Y. R., Kim, M. W., Valint, P., and Bock, J., Phys. Rev. A 31, 537 (1985).CrossRefGoogle Scholar
24. Rasing, Th., Shen, Y. R., Kim, M. W., and Grubb, S. (to be published).Google Scholar
25. Haight, R., Bokor, J., Stark, J., Storz, R. H., Freeman, R. R., and Bucksbaum, P. H., Phys. Rev. Lett. 54, 1302 (1985).CrossRefGoogle Scholar