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Nonlinear Optical Properties of Si Nanocrystals

Published online by Cambridge University Press:  01 February 2011

Rita Spano
Affiliation:
[email protected], Università di Trento, Physics, via Sommarive 14, I-38050, Povo (Trento), Trento, 38050, Italy, +39 0461 882070, +39 0461 881696
Massimo Cazzanelli
Affiliation:
[email protected], Università di Trento, Dipartimento di Fisica, Via Sommarive 14, Trento, I-38050, Italy
Nicola Daldosso
Affiliation:
[email protected], Università di Trento, Dipartimento di Fisica, Via Sommarive 14, Trento, I-38050, Italy
Zeno Gaburro
Affiliation:
[email protected], Università di Trento, Dipartimento di Fisica, Via Sommarive 14, Trento, I-38050, Italy
Luigi Ferraioli
Affiliation:
[email protected], Università di Trento, Dipartimento di Fisica, Via Sommarive 14, Trento, I-38050, Italy
Luca Tartara
Affiliation:
[email protected], Università di Pavia, Dipartimento di Elettronica, Via Ferrata 1, Pavia, I-27100, Italy
Jin Yu
Affiliation:
[email protected], Università di Pavia, Dipartimento di Elettronica, Via Ferrata 1, Pavia, I-27100, Italy
Vittorio Degiorgio
Affiliation:
[email protected], Università di Pavia, Dipartimento di Elettronica, Via Ferrata 1, Pavia, I-27100, Italy
Sergi Hernandez
Affiliation:
[email protected], Universitat de Barcelona, Departament d'Electrònica, Martì i Franquès 1, Barcelona, 08028, Spain
Youcef Lebour
Affiliation:
[email protected], Universitat de Barcelona, Departament d'Electrònica, Martì i Franquès 1, Barcelona, 08028, Spain
Paolo Pellegrino
Affiliation:
[email protected], Universitat de Barcelona, Departament d'Electrònica, Martì i Franquès 1, Barcelona, 08028, Spain
Blas Garrido
Affiliation:
[email protected], Universitat de Barcelona, Departament d'Electrònica, Martì i Franquès 1, Barcelona, 08028, Spain
Emmanuel Jordana
Affiliation:
[email protected], CEA-LETI, 17, rue des Martyrs, Grenoble Cedex 9, 38054, France
Jean Marc Fedeli
Affiliation:
[email protected], CEA-LETI, 17, rue des Martyrs, Grenoble Cedex 9, 38054, France
Lorenzo Pavesi
Affiliation:
[email protected], Università di Trento, Dipartimento di Fisica, Via Sommarive 14, Trento, I-38050, Italy
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Abstract

A systematic study of nonlinear optical properties of silicon nanocrystals (Si-nc) grown by plasma enhanced chemical vapor deposition (PECVD) is reported. Nonlinear optical refraction and absorption have been measured by z-scan technique at three different time regimes and at different wavelengths to investigate both the thermal and electronic responses. For this purpose three different laser sources have been used. Different behaviors, as expected from the theory, for different pump pulse durations are observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

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