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Non-Destructive X-Ray Diffraction with 30-Micron Spatial Resolution: Some Examples

Published online by Cambridge University Press:  28 February 2011

M. Inaba ,
J. Miyata  and
R. Sugisita
M. Inaba
Affiliation:
Conservation Laboratory, Tokyo Geijutsu Daigaku, Tokyo National University of Fine Arts and Music, Ueno Koen, Taito-ku, Tokyo 110, Japan
J. Miyata
Affiliation:
Conservation Laboratory, Tokyo Geijutsu Daigaku, Tokyo National University of Fine Arts and Music, Ueno Koen, Taito-ku, Tokyo 110, Japan
R. Sugisita
Affiliation:
Conservation Laboratory, Tokyo Geijutsu Daigaku, Tokyo National University of Fine Arts and Music, Ueno Koen, Taito-ku, Tokyo 110, Japan
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Abstract

We have been measuring x-ray diffraction spectra of small samples of layers in cross-sections using a Micro X-ray diffractometer (PSPC/MDG) system since 1988. In measuring with xray diffractometry, the position sensitive proportional counter (PSPC) covers 150 degrees of x-ray diffraction, continuously. The data are accumulated by the multichannel analyser (MCA) and monitored on a CRT during the measurement period. Mounted samples can rotate around three axes. The XRD spectra are very like those from a wide angle goniometer used in powder diffraction. Normally the spatial limits are around 30 microns in diameter, as we have found experimentallly in our samples. We feel this system is very feasible for art and archaeological studies. Some case studies are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 267: Symposium J – Materials Issues in Art and Archaeology III , 1992 , 255
Copyright
Copyright © Materials Research Society 1992

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References

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