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A New Ultra-High Resolution TEM, EM-002b, with a Unique Uhr Objective Lens Configuration

Published online by Cambridge University Press:  21 February 2011

T. Yanaka ,
K. Moriyama  and
R. Buchanan
T. Yanaka
Affiliation:
Akashi Beam Technology Corporation Application Center, 1-29- 19 Akatsukicho Hachioji, Tokyo, Japan 192
K. Moriyama
Affiliation:
Akashi Beam Technology Corporation Application Center, 1-29- 19 Akatsukicho Hachioji, Tokyo, Japan 192
R. Buchanan
Affiliation:
International Scientific Instruments, Inc., 1457 McCarthy Boulevard, Milpitas, California 95035 U.S.A.
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Abstract

Simultaneous achievement of atomic resolution,

,

zone axis alignment of crystals (>5nm), diffraction studies of crystals (>0.5nm), and x-ray analysis of precipitates (>1nm) have been possible in a unique new TEM (EM-002B) in its UHR configuration.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 271
Copyright
Copyright © Materials Research Society 1989

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References

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