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A New Tripod Polisher Method For Preparing Tem Specimens of Particles and Fibers

Published online by Cambridge University Press:  10 February 2011

Ron Arlderson
Affiliation:
IBM Analytical Services, 1580 Route 52, Mail Stop E40, Hopewell Junction, NY 12533 USA
Stanley J. Klepeis
Affiliation:
IBM Analytical Services, 1580 Route 52, Mail Stop E40, Hopewell Junction, NY 12533 USA
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Abstract

A tripod polisher method that extends the use of the tool to the preparation of difficult particulate and fiber specimens, sufficiently thin to permit direct TEM examination with minimal or no ion milling, is detailed. The specimen is surrounded with Si in order to take advantage of the colour changes displayed by thin Si to assess the thickness of the specimen during preparation.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

Klepeis, S. J., et al., in Specimen Preparation for Transmission Electron Microscopy of Materials, ed. Bravman, , et al., Mater. Res. Soc. Proc. 115, Pittsburgh, PA USA p. 179 (1987).Google Scholar
Anderson, R. M., et al., Microscopy of Semiconducting Materials 1989, Proceedings of the Physics Conference held at Oxford University, 10–13 April 1989, ed. by A.G., Cullis and J.L., Hutchison, Institute of Physics Conference Series Number 100, Bristol and New York, 1989.Google Scholar
J.P., Benedict et al., EMSA Bulletin, 19, 2, p. 74, 1989.Google Scholar
S.J., Klepeis, et al., EMSA Proceedings, ed. by Bailey, Francisco, G.W., San Press, p. 712, 1989.Google Scholar
J.P., Benedict, et al., in International Symposium on Electron Microscopy, ed. by K., Kuo and J., Yao, World Scientific, p. 450, 1990.Google Scholar
J., Benedict, et al., in Specimen Preparation for Transmission Electron Microscopy of Materials II, ed. R., Anderson, Mater. Res. Soc. Proc. 199, Pittsburgh, PA USA p. 189 (1990).Google Scholar
J, Benedict. et al. in Specimen Preparation for Transmission Electron Microscopy of Materials-Ill, ed. , Anderson et al., Mater. Res. Soc. Proc. 254, Pittsburgh, PA USA p. 121 (1992).Google Scholar
R., Andersonin Specimen Preparation for Transmission Electron Microscopy of Materials-III, ed. Anderson, , et al., Mater. Res. Soc. Proc. 254, Pittsburgh, PA USA p. 141 (1992).Google Scholar
R., Anderson, et al., Microbeam Analysis–1995, Proceedings of the 29th Annual Meeting of the Microbeam Analysis Society, ed. Etz, E., p. 135, 1995.Google Scholar