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A New Tripod Polisher Method For Preparing Tem Specimens of Particles and Fibers

Published online by Cambridge University Press:  10 February 2011

Ron Arlderson  and
Stanley J. Klepeis
Ron Arlderson
Affiliation:
IBM Analytical Services, 1580 Route 52, Mail Stop E40, Hopewell Junction, NY 12533 USA
Stanley J. Klepeis
Affiliation:
IBM Analytical Services, 1580 Route 52, Mail Stop E40, Hopewell Junction, NY 12533 USA
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Abstract

A tripod polisher method that extends the use of the tool to the preparation of difficult particulate and fiber specimens, sufficiently thin to permit direct TEM examination with minimal or no ion milling, is detailed. The specimen is surrounded with Si in order to take advantage of the colour changes displayed by thin Si to assess the thickness of the specimen during preparation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 480: Symposium Z – Specimen Preparation for Transmission Electron Microscopy…IV , 1997 , 193
Copyright
Copyright © Materials Research Society 1997

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References

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