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A New Tripod Polisher Method For Preparing Tem Specimens of Particles and Fibers
Published online by Cambridge University Press: 10 February 2011
Abstract
A tripod polisher method that extends the use of the tool to the preparation of difficult particulate and fiber specimens, sufficiently thin to permit direct TEM examination with minimal or no ion milling, is detailed. The specimen is surrounded with Si in order to take advantage of the colour changes displayed by thin Si to assess the thickness of the specimen during preparation.
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- Copyright © Materials Research Society 1997
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