Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-27T02:14:44.258Z Has data issue: false hasContentIssue false

New Optical Transition at Thermal Donors in Silicon

Published online by Cambridge University Press:  28 February 2011

J. Weber
Affiliation:
Max-Planck-Institut für Festkörperforschung, Heisenbergstr. 1, D-7000 Stuttgart 1, Federal Republic of Germany
H. J. Queisser
Affiliation:
Max-Planck-Institut für Festkörperforschung, Heisenbergstr. 1, D-7000 Stuttgart 1, Federal Republic of Germany
Get access

Abstract

We detect new luminescence lines in Czochralski-grown silicon after prolonged heat treatments at 450°C. The properties of the new optical transition are well explained by a thermal donor-free hole recombination. From the IR-absorption spectra measured on the same samples, we have evidence for an inhomogeneous distribution of the thermal donors. The spatial fluctuations of the thermal donors appear to be necessary for the new luminescence spectrum to emerge.

Type
Research Article
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Kaiser, W., Frisch, H.L., Reiss, H., Phys. Rev. 112, 1546 (1958)Google Scholar
[2] Patel, J.R., in Semiconductor Silicon 1981, edid by Huff, H.R., Kriegler, R.J., and Takeishi, Y. (Electrochemical Society, Pennington, 1981), p.89 Google Scholar
[3] Oeder, R., Wagner, P. in “Defects in Semiconductors II”; MRS Symposia Proceedings Vol.14, Mahajan, S., Corbett, J.W., Eds., North Holland 1982, p. 171 Google Scholar
[4] Stavola, M., Lee, K.M., Nabity, J.C., Freeland, P.E. and Kimerling, L.C., Phys. Rev. Lett. 54, 2639 (1985)CrossRefGoogle Scholar
[5] Lee, K.M., Trombetta, J.M. and Watkins, G.D., in Proceedings of the Symposium on Microscopic Identification of Defects in Semiconductors, San Francisco, 1985 (to be published)Google Scholar
[6] Weber, J. and Sauer, R. in “Defects in Semiconductors II”; MRS Symposia Proceedings, Vol.14, Mahajan, S., Corbett, J.W., Eds., North Holland 1982, p.165 Google Scholar
[7] Bebb, H.B. and Williams, E.W. in “Semiconductors and Semimetals”, vol.8, p.181, edited by Willardson, R.K., Beer, A.C., Academic Press, New York/London, 1972 Google Scholar
[8] Weber, J., Schmid, W., and Sauer, R., Phys. Rev. B21, 2401 (1980)CrossRefGoogle Scholar
[9] Wagner, P., Holm, C., Sirtl, E., Oeder, R., Zulehner, W. in “Festkdrperprobleme” (Advances in Solid State Physics), vol.XXIV, p.191, Grosse, P. (ed.), Vieweg, Braunschweig, 1984 Google Scholar
[10] Jgannath, C., Gabrowski, Z.W. and Ramdas, A.K., Phys. Rev. B 23, 2082 (1981)CrossRefGoogle Scholar
[11] Newman, R., Phys. Rev. 103, 103 (1956)Google Scholar