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A New Method of Preparing Tilt Boundaries for High Resolution Electron Microscopy
Published online by Cambridge University Press: 21 February 2011
Abstract
A new method of preparing bicrystal substrates of NaCl with a common tilt zone axis has been developed. Upon a lateral overgrowth of NaCl, bridging the two mechanically polished and oriented crystals, very thin films can then be vapor deposited. Au bicrystals of ∼ 75Å thickness and b.c.c. Cr films of similar thickness with grain boundaries have been fabricated.
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- Copyright © Materials Research Society 1988