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A new method of manufacturing high aspect ratio structures using SU8 negative photoresist

Published online by Cambridge University Press:  01 February 2011

Saydulla Persheyev
Affiliation:
Mervyn John Rose
Affiliation:
[email protected], University of Dundee, Electronics Engineering and Pysics, Dundee, United Kingdom
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Abstract

SU8 Negative photoresist is finding high demand in applications such as MEMS sensors and waveguides. The possibility of photolithographic patterning and high physical and dielectric properties are attracting ever more users among workers in the electronics industry and increasingly in biomedical applications. In our work we employ an original method of exposing of SU8 and create high aspect ratio structures on glass and other substrates. Dry plasma etching results of negative epoxy-based photoresist by Inductively Coupled Plasma system using gases O2 and CF4 are presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

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References

REFERENCES

1 Butefisch, S., Seideman, V.S, eideman, S., Buttgenbach Buttgenbach, Sensors and Ac Actuators A 97 97–98 (2002) 638645 Google Scholar
2 Choi, Y.Cho, McClain, M., LaPlaca, M., Frazier, A., Allen, M. Allen, Biomedical Microdevices, Volume 9, No1, February 2007, pp.7 713 (7)Google Scholar
3 Chank-Park, M.B., Zhan, J., Yan, Y., Yue, C.Y., Sensors and Actuators B 101 (2004) 175182 Google Scholar
4 Sato, H., Houshi, Y., Otsuka, T. and Shoji, S., Japanese Journal of Applied Physics Vol. 43, No. 12, 2004, pp. 83418344 Google Scholar
5 Ransley, J.H.T., Watari, M., Sukumaran, D., McKendry, R.A., Seshia, A.A., Microelectronic Engineering 83 (2006)16211625 Google Scholar
6 Ruano-Lopez, J.M., Aguirregabiria, M., Tijero, M., Arroyo, M.T., Elizalde, J., Berganzo, J., Aranburu, I., Blanco, F.J., Mayora, K., Sensors and Actuators B 114 (2006) 542551,Google Scholar
7 Song, Yujun, Kumar, Challa S S R and Hormes, JosefJ. Micromech. Microeng.14 (2004) £932–940Google Scholar
8 Bohl, B., Steger, R., Zengerle, R. and Koltay, P., Journal of Micromechanics and Micr Microengineering 15 (2005) 1125 oengineering 1125–1130Google Scholar
9 Lee, C.-H., Chang, T.-W., Lee, K.-L., Lin, J.-Y. Appl. Phys. A79, 20272031 (2004)Google Scholar
10 Elgaid, K., McCloy, D.A., Thayne, I.G., Microelectronic Engineering 67–68 (2003) 417421 Google Scholar
Hong, G., Holmes, A. S., Heaton, M. E., “DTIP 2003, Mandelieu – La Napoule, France, 5–7 May 2003, pp. 268271 Google Scholar