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New Directions for Low Dimensional Thermoelectricity

Published online by Cambridge University Press:  01 February 2011

M. S. Dresselhaus
Affiliation:
Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139 Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139
Y. M. Lin
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139
M. R. Black
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139
O. Rabin
Affiliation:
Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA 02139
G. Dresselhaus
Affiliation:
Francis Bitter Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139

Abstract

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Low dimensionality provides opportunities to modify the properties of bulk materials dramatically and to control materials properties independently in a manner that is not possible for bulk materials. The special characteristics of low dimensional materials to enhance thermoelectric performance have already been demonstrated in quantum wells, quantum wires and quantum dots. The main focus of this review is a summary of advances made in the modeling of quantum dot superlattice nanowires. Several new research directions for low dimensional thermoelectricity or inspired by this research are briefly mentioned.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

References

REFERENCES

[1] Hicks, L. D. and Dresselhaus, M. S., Phys. Rev. B 47, 1272712731 (1993).Google Scholar
[2] Hicks, L. D. and Dresselhaus, M. S., Phys. Rev. B 47, 1663116634 (1993).Google Scholar
[3] Venkatasubramanian, R., Siivola, E., Colpitts, T., and O'Quinn, B., Nature 413, 597 (2001).Google Scholar
[4] Lin, Y.-M., Sun, X., and Dresselhaus, M. S., Phys. Rev. B 62, 46104623 (2000).Google Scholar
[5] Dresselhaus, M. S., Lin, Yu-Ming, Cronin, S. B., Rabin, O., Black, M. R., Dresselhaus, G., and Koga, T.. In Semiconductors and Semimetals: Recent Trends in Thermoelectric Materials Research III, edited by Tritt, T. M., pages 1–121, Academic Press, San Diego, CA, 2001. Chapter 1.Google Scholar
[6] Hárman, T. C., Taylor, P. J., Walsh, M. P., and LaForge, B. E., Science 297, 22292232 (2002).Google Scholar
[7] Piraux, L., George, I. M., Despres, J. F., Leroy, C., Ferain, E., Legras, R., Ounadjela, K., and Fert, A., Appl. Phys. Lett. 65, 24842486 (1994).Google Scholar
[8] Balandin, A. A. and Lazarenkova, O. L., Appl. Phys. Lett. 82, 415 (2003).Google Scholar
[9] Dames, C. and Chen, G., (2003). J. Appl. Phys.(to be published).Google Scholar
[10] Lin, Yu-Ming and Dresselhaus, M. S., Phys. Rev. B 68, 075304(114) (2003).Google Scholar
[11] Wu, Y., Fan, R., and Yang, P., Nano Lett. 2, 83 (2002).Google Scholar
[12] Gudiksen, M. S., Lauhon, L. J., Wang, J., Smith, D. C., and Lieber, C. M., Nature 415, 617620 (2002).Google Scholar
[13] Bjork, M. T., Ohlsson, B. J., Sass, T., Persson, A. I., Thelander, C., Magnusson, M. H., Deppert, K., Wallenberg, L. R., and Samuelson, L., Nano Lett. 2, 8789 (2002).Google Scholar
[14] Dalven, R., Infrared Physics 9, 141184 (1969).Google Scholar
[15] Allgaier, R. S. and Scanlon, W. W., Phys. Rev. 111, 1029 (1958).Google Scholar
[16] Heremans, J. P., MRS Fall meeting, 2003 paper S1.1. Google Scholar
[17] Yang, R. and Chen, G., MRS Fall meeting, 2003 paper S5.2. Google Scholar
[18] Rabin, O., Chen, G. and Dresselhaus, M.S., MRS Fall meeting, 2003 paper S5.4. Google Scholar
[19] Rabin, O., Dresselhaus, M.S., MRS Fall meeting, 2003 paper L12.1. Google Scholar
[20] Black, M. R., Hagelstein, P. L., Cronin, S. B., Lin, Y.-M., and Dresselhaus, M. S., Phys. Rev. B 68 (2003).Google Scholar