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A New Approach For Dielectric Measurements At High Temperatures

Published online by Cambridge University Press:  10 February 2011

C. Groffils ,
P. J. Luypaert ,
Y. Zhou  and
O. Van der Biest
C. Groffils
Affiliation:
MEAC, I&I K.U.Leuven, Kapeldreef 60, 3001 Heverlee, Belgium
P. J. Luypaert
Affiliation:
MEAC, I&I K.U.Leuven, Kapeldreef 60, 3001 Heverlee, Belgium
Y. Zhou
Affiliation:
Dept. of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, De-Croylaan 2, B-3001 Heverlee, Belgium.
O. Van der Biest
Affiliation:
Dept. of Metallurgy and Materials Engineering, Katholieke Universiteit Leuven, De-Croylaan 2, B-3001 Heverlee, Belgium.
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Abstract

Most of the algorithms for cavity dielectric measurements use a full network frequency scan for the perturbation method. At high temperature the measurement points in one frequency scan will have different temperatures due to the fast cooling of the sample inside the cold cavity. This paper presents a new approach for the perturbation method to measure dielectric constants at high temperatures with a two port, two piston cylindrical cavity and external furnace. Special features of this cavity are the possibility to work with different modes and different relative positions of the coupling aperture.

The dielectric properties are extracted from the full sets of S-parameters for two successive frequency points corresponding to approximately the same temperatures. An extraction algorithm is developed and programmed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996 , 251
Copyright
Copyright © Materials Research Society 1996

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References

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