Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-23T16:25:41.435Z Has data issue: false hasContentIssue false

Negative Index Metamaterials with Deeply Subwavelength Structural Dimensions from Near Infrared to Visible Based on Thin Filmsββ

Published online by Cambridge University Press:  26 February 2011

Vitaliy Lomakin
Affiliation:
[email protected], University of California, San Diego, Department of Electrical and Computer Engineering, 9500 Gilman Drive, La Jolla, CA, 92093, United States, 858 822 4726
Yeshaiahu Fainman
Affiliation:
[email protected], University of California, San Diego, Department of Electrical and Computer Engineering, 9500 Gilman Drive, La Jolla, CA, 92093, United States
Gennady Shvets
Affiliation:
[email protected], University of Texas, Austin, Physics, Austin, CA, 78712, United States
Get access

Abstract

Novel two and three-dimensional doubly negative metamaterials (DNM), viz. metamaterial with simultaneously negative permittivity, permeability, and index of refraction, are introduced. The metamaterials comprise deeply subwavelength periodic unit cells, can be tuned to operate in the near infra-red and visible spectra, and can be manufactured using standard nanofabrication methods with compatible materials. The DNMs' unit cell comprises an optically thin metal film sandwiched between two thin metal strips or patches residing at a small distance from the film. The cavity formed between the strips or patches supports resonances with magnetic and electric response that can be tuned to exist in overlapping frequency bands thus leading to the DNM operation.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Pendry, J. B., Phys. Rev. Lett. 85, 3966 (2000)Google Scholar
2. Shelby, R., Smith, D. R. and Schultz, S., Science, 292, 77 (2001)Google Scholar
3. Zhou, J., et al, Phys. Rev. Lett. 95, 223902 (2005).Google Scholar
4. Shvets, G. and Urzhumov, Y. A., Phys. Rev. Lett. 93, 243902 (2004)Google Scholar
5. Alu, A., Salandrino, A., and Engheta, N., Opt. Express 14, 1557 (2006).Google Scholar
6. Shalaev, V. M., et al, Opt. Lett. 30, 3356 (2005)Google Scholar
7. Shvets, G. and Urzhumov, Y. A., J. Opt. A: Pure Appl. Opt. 8, S122 (2006)Google Scholar
8. Shuang, Z., Wenjun, F., Panoiu, N. C., Malloy, K. J., Osgood, R. M., and Brueck, S. R. J., Phys. Rev. Lett. 95, 137404 (2005).Google Scholar
9. Dolling, G., Enkrich, C., Wegener, M., Soukoulis, C. M., and Linden, S., Science 312, 892 (2006).Google Scholar
10. Chettiar, U.K., Kildishev, A.V., Klar, T.A., and Shalaev, V. M., Optics Express 14, 7872 (2006).Google Scholar
11. Lomakin, V., Fainman, Y., Urzhumov, Y., and Shvets, G., Optics Express 14, 11164 (2006).Google Scholar
12. Balanis, K., Antenna Theory Analysis and Design, Wiley, 1996 Google Scholar
13. Jin, J., The Finite Element Method in Electromagnetics, Wiley, 2002 Google Scholar
14. Moharam, M.G., Grann, E.B., and Pommet, D.A., J. Opt. Soc. Am. A 5, 1068 (1995)Google Scholar
15. Peterson, A. F., Ray, S. and Mittra, R., Computational Methods in Electromagnetics, IEEE Press, 1997.Google Scholar
15. 16. Smith, D. R., Schultz, S., Markoš, P., and Soukoulis, C. M., Phys. Rev. B 65, 195104 (2002).Google Scholar
17. Johnson, P. B. and Christy, R. W., Phys. Rev. B 6, 4370 (1972).Google Scholar