Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-27T11:06:31.703Z Has data issue: false hasContentIssue false
  • English
  • Français

Near field Optical second Harmonic Imaging of the Polydomain Structure of Epitaxial PbZrxTi1−xO3 thin films

Published online by Cambridge University Press:  21 March 2011

H.Y. Liang ,
I.I. Smolyaninov ,
C.H. Lee ,
C.C. Davis ,
V. Nagarajan  and
R. Ramesh
H.Y. Liang
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
I.I. Smolyaninov
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
C.H. Lee
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
C.C. Davis
Affiliation:
Electrical and Computer Engineering Department, University of Maryland, College Park, MD 20742, USA
V. Nagarajan
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742, USA
R. Ramesh
Affiliation:
Department of Materials and Nuclear Engineering, University of Maryland, College Park, MD 20742, USA
Get access

Abstract

Near field optical second harmonic microscopy has been applied to imaging of the c/a/c/a polydomain structure of epitaxial PbZrxTi1−xO3 thin films in the 0<x<0.4 range. An uncoated adiabatically tapered fiber tip was employed in our microscope which, according to our previous research [5] could yeild a resolution of up to 80 nm. Experimentally measured nearfield second harmonic images have been compared with the results of theoretical calculations. Good agreement between theory and experiment has been demonstrated. Thus, novel optical technique for nanometer scale ferroelectric domain imaging has been developed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 655 , 2000 , CC8.9.1
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Auciello, O., Scott, J. F., and Ramesh, R., Physics Today, N7, 22–27 (1998)10.1063/1.882324Google Scholar
2. Rotter, L. D., Kaiser, D. L., and Vaudin, M. D., Appl. Phys. Lett. 68, 310 (1996)Google Scholar
3. Gruverman, A., Tokumoto, H., Prakash, A. S., Aggarwal, S., Yang, B., Wutttig, M., Ramesh, R., Auciello, O., and Venkatesan, T. Appl. Phys. Lett. 71, 3492 (1997)10.1063/1.120369Google Scholar
4. Shen, Y.R., The Principles of Nonlinear Optics. (Wiley, New York, 1984)Google Scholar
5. Smolyaninov, I. I., Liang, H. Y., Lee, C. H., Davis, C. C., Aggarwal, S., and Ramesh, R., Optics Letters 25, 835–837 (2000); I.I.Smolyaninov, H.Y.Liang, C.H.Lee, and C.C.Davis, J. of Appl. Phys. 89, 206–211 (2001).10.1364/OL.25.000835Google Scholar
6. Alpay, S. P., Nagarajan, V., Bendersky, L. A., Vaudin, M. D., Aggarwal, S., Ramesh, R., and Roytburd, A. L., J.Appl.Phys. 85, 3271–3277. (1999)Google Scholar
7. Smolyaninov, I. I., Lee, C. H., and Davis, C. C., Phys.Rev.Lett. 83, 2429–2432. (1999)10.1103/PhysRevLett.83.2429Google Scholar
8. Zernike, F., and Midwinter, J. E., Applied Nonlinear Optics (Wiley, New York, 1973)Google Scholar