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Nanoscale Surface Modification of UltraHigh Molecular Weight Polyethylene (UHMWPE) Samples with the W + C Ion Implantation

Published online by Cambridge University Press:  01 February 2011

E. Sokullu Urkac ,
A. Oztarhan ,
F. Tihminlioglu ,
N. Kaya ,
S. Budak ,
B. Chhay ,
C. Muntele ,
E. OKs ,
A. Nikolaev  and
D. ILA
E. Sokullu Urkac
Affiliation:
[email protected], Ege University, Department of Bioengineering, Bornova, 35100, Turkey
A. Oztarhan
Affiliation:
[email protected], Ege University, Department of Bioengineering, Bornova, 35100, Turkey
F. Tihminlioglu
Affiliation:
[email protected], IYTE, Department of Chemical Engineering, Urla, 35000, Turkey
N. Kaya
Affiliation:
[email protected], Ege University, Department of Bioengineering, Bornova, 35100, Turkey
S. Budak
Affiliation:
[email protected], Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Huntsville, AL, 35762, United States
B. Chhay
Affiliation:
[email protected], Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Huntsville, AL, 35762, United States
C. Muntele
Affiliation:
[email protected], Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Huntsville, AL, 35762, United States
E. OKs
Affiliation:
[email protected], High Current Electronics Institute, Tomsk, 44000, Russian Federation
A. Nikolaev
Affiliation:
[email protected], High Current Electronics Institute, Tomsk, 44000, Russian Federation
D. ILA
Affiliation:
[email protected], Alabama A&M University, Center for Irradiation of Materials, 4900 Meridian Street, PO Box 1447, Huntsville, AL, 35762, United States
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Abstract

In this work, Ultra High Molecular Weight Poly Ethylene (UHMWPE) samples were implanted with W + C ion by using Metal-Vapour Vacuum Arc (MEVVA) ion implantation technique. Samples were implanted with W and C atoms with a fluence of 1017ion/cm2 and extraction voltage of 30 kV. Mechanism underlies this modification characterized with ATR-FTIR, UV-VIS-NIR Spectrum and Rutherford Backscattering Spectrometry (RBS). Surface morphology of implanted and unimplanted samples were examined in nanoscale with AFM.

Keywords

nanoscaleion-implantationpolymerization
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1020: Symposium GG – Ion-Beam-Based Nanofabrication , 2007 , 1020-GG07-05
Copyright
Copyright © Materials Research Society 2007

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