Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-23T05:17:58.847Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanometer-Scale Measurements of Mechanical Properties and Composition in an Ion Implanted Titanium–Based Alloy

Published online by Cambridge University Press:  10 February 2011

M. Kunert ,
B. Baretzky ,
S. P. Baker  and
E. J. Mittemeijer
M. Kunert
Affiliation:
Max–Planck–Institut für Metallforschung, Seestrasse 92, 70174 Stuttgart, Germany
B. Baretzky
Affiliation:
Max–Planck–Institut für Metallforschung, Seestrasse 92, 70174 Stuttgart, Germany
S. P. Baker
Affiliation:
Cornell University Department of Materials Science and Engineering, 129 Bard Hall, Ithaca, NY 14853-1501
E. J. Mittemeijer
Affiliation:
Max–Planck–Institut für Metallforschung, Seestrasse 92, 70174 Stuttgart, Germany
Get access

Abstract

A new method for hardness–depth profiling on the nanometer scale has been developed. In this method, the hardness–depth profile was obtained by a stepwise removal of a surface layer by ion sputtering and measurement of the hardness by nanoindentation at each step using the same maximum load (250 μN). During removal of each surface layer the composition was obtained using Auger electron spectroscopy. For comparison, the hardness–depth profile was also assessed by a stepwise increase of the maximum load applied to the original surface. The sample used in these experiments was a Ti–6Al–4V cast alloy, doubly implanted with carbon (120 kV/3 · 1017 cm−2 and 60 kV/4 · 1017 cm−2). The hardness–depth profiles were related to the composition–depth profile. It followed that only the constant load and removal method provides a direct relation between hardness and composition at a given depth.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 522: Symposium T – Fundamentals of Nanoindentation & Nanotribology , 1998 , 95
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Hirvonen, J. K., Ion Implantation, Treatise on Materials Science and Technology 18 (Academic Press, Inc., New York, 1980).Google Scholar
[2] Was, G. S., Progr. Surf. Sci. 32, 211–332 (1990).Google Scholar
[3] Bolster, R. N., Singer, I. L. and Vardiman, R. G., Surf. Coat. Technol. 33, 469–477 (1987)Google Scholar
[4] Alonso, F., Arizaga, A., Quainton, S., Ugarte, J. J., Viviente, J. L. and Oñate, J. I., Surf. Coat. Technol. 74/75, 986–992 (1995).Google Scholar
[5] Rück, D. M., Andert, N., Emig, H., Leible, K. D., Spädtke, P., Vogt, D. and Wolf, B. H., Nucl. Tracks Radiat. Meas. 19, 951–954 (1991).Google Scholar
[6] Schmidt, H., Schminke, A. and Rück, D. M., Wear 209, 49–56 (1997).Google Scholar
[7] Oliver, W. C. and Pharr, G. M., J. Mater. Res. 7, 1564–1583 (1992).Google Scholar
[8] CRC Handbook of Chemistry and Physics, 65th ed., ed. by Weast, R. C. (CRC Press, Inc., 1984–1985).Google Scholar
[9] Sigmund, P., in Sputtering by Particle Bombardement I, ed. by Behrisch, R. (Springer-Verlag, Berlin-Heidelberg-New York, 1981), pp. 9–71.Google Scholar
[10] Kunert, M., Baretzky, B., Baker, S. P. and Mittemeijer, E. J., in preparation.Google Scholar
[11] Liu, B. X., Wang, J. and Cheng, X. Y., phys. stat. sol. (a) 128, K 71 (1991).Google Scholar
[12] Wenzel, A., Hammerl, C., Königer, A. and Rauschenbach, B., Nucl. Instr. Meth. B 129, 369–376 (1997).Google Scholar
[13] Johnson, K. L., J. Mech. Phys. Sol. 18, 115–126 (1970).Google Scholar
[14] Bhattacharya, A. K. and Nix, W. D., Int. J. Solids Struc. 24, 1287–1298 (1988).Google Scholar
[15] Fabes, B. D., Oliver, W. C., McKee, R. A. and Walker, F. J., J. Mater. Res. 7, 3056–3064 (1992).Google Scholar