Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-06T10:41:02.731Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanometer Thermal Conductivity Mapping Using Laser-based Scanning Thermal Microscopy

Published online by Cambridge University Press:  24 March 2015

Jeremy Goeckeritz ,
Gary Aden  and
Ami Chand
Jeremy Goeckeritz
Affiliation:
Applied Nanostructures, 415 Clyde Ave. Suite 102, Mountain View, CA 94043, U.S.A.
Gary Aden
Affiliation:
Applied Nanostructures, 415 Clyde Ave. Suite 102, Mountain View, CA 94043, U.S.A.
Ami Chand
Affiliation:
Applied Nanostructures, 415 Clyde Ave. Suite 102, Mountain View, CA 94043, U.S.A.
Get access

Abstract

A new measurement technique using a cantilever probe with an integrated thermal sensor is investigated for measuring thermal conductivity at the nanometer scale. The probe is used in a configuration wherein the laser from an atomic force microscope (AFM) heats the tip of the probe above ambient temperature. Heat is transferred from the probe to a sample based on the thermal conductivity of the sample. The heat flow creates a temperature change, as small as 0.01 °C, which is detected by the thermal sensor. The measurement technique presented offers a simple and effective method for mapping the thermal conductivity of a number of materials. We explore the ability of the technique to map silicon oxide on silicon, carbon fibers and gold nanoparticles. Analysis shows that the technique can be used to produce images with a thermal resolution surpassing 25 nm.

Keywords

nanoscalethermal conductivityscanning probe microscopy (SPM)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1754: Symposium OO/PP/QQ/TT – State-of-the-Art Developments in Materials Characterization , 2015 , pp. 81 - 86
Copyright
Copyright © Materials Research Society 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Davis, R.C., Williams, C. C., Neuzil, P., Appl. Phys. Lett. 66, 2309 (1995).CrossRefGoogle Scholar
Leinhos, T., Stopka, M., Oesterschulze, E., Appl. Phys. A 66, S65 (1998).CrossRefGoogle Scholar
Barnes, J. R., Stephenson, R. J., Woodburn, C. N., O’Shea, S. J., Welland, M. E., Rayment, T., Gmzewski, J. K., Gerber, Ch., Rev. Sci. Instrum. 65, 3793 (1994).CrossRefGoogle Scholar
Yue, Y., Wang, X., Nano Rev. 3, 11586-DOI: 10.3402/nano.v3i0.11586 (2012).CrossRefGoogle Scholar
Józwiak, G., Wielgoszewski, G., Gotszalk, T., Kepinski, L., Ultramicroscopy 133, 80 (2013).CrossRefGoogle Scholar
Weinrib, H., Meiri, A., Duadi, H., and Fixler, D., Journal of Atomic, Molecular, and Optical Physics, 2012, 683830 (2012).CrossRefGoogle Scholar
Tseng, J., Lin, M., Chau, L., Colloids and Surfaces A: Physicochemical and Engineering Aspects, 182, 239–245, (2001).CrossRefGoogle Scholar