Hostname: page-component-7bb8b95d7b-dtkg6 Total loading time: 0 Render date: 2024-09-12T07:28:05.215Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoidentation Study of the Mechanical Properties of Granular Metal Thin Films

Published online by Cambridge University Press:  15 February 2011

M. R. Scanlon ,
M. K. Ferber  and
R. C. Cammarata
M. R. Scanlon
Affiliation:
The Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218
M. K. Ferber
Affiliation:
High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, TN 37831-0117
R. C. Cammarata
Affiliation:
The Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218
Get access

Abstract

Nanoindenter techniques have been used to investigate the mechanical properties of Ag-Al2O3 and Fe-SiO2 granular metal films. A discontinuity in the rate of change of hardness as a function of metal volume fraction p was observed. The discontinuity occurs at the percolation threshold pc of the metal, and appears to result from a change in the deformation mechanism at pc. A large peak in compliance (inverse modulus) as measured during indentation unloading was observed in the Ag-Al2O3 films near pc, but was not observed for the Fe-SiO2 films. The compliance peak displayed by Ag-Al2O3 is believed to result from debonding at the metal-ceramic interface and subsequent interfacial sliding, and is not an intrinsic materials property.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 308: Symposium M1 – Thin Films: Stresses and Mechanical Properties IV , 1993 , 555
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Abeles, B., Sheng, P., Courts, M. D. and Arie, Y., Adv. Phys., 24, 407 (1975).CrossRefGoogle Scholar
2 Schlesinger, T. E., Cammarata, R. C., Gavrin, A., Xiao, J. Q., Chien, C. L., Ferber, M. K. and Hayzelden, C., J. Appl. Phys., 70, 3275 (1991).Google Scholar
3 Xiao, G. and Chien, C. L., Appl. Phys. Lett., 51, 1280 (1987).Google Scholar
4 Schlesinger, T. E., Ph.D. Thesis, The Johns Hopkins University, 1991.Google Scholar
5 Chien, C. L., in Recent Advances in Magnetism and Magnetic Materials, edited by Huang, H. L. and Kuo, P. C. (World Scientific, Singapore, 1990), p. 296.Google Scholar
6 Doerner, M. F. and Nix, W. D., J. Mater. Res., 1, 601 (1986).Google Scholar
7 Shah, S.I., Doele, B. A., Weerasekera, I. and Unrah, K. M., Thin Solid Films, 206, 264 (1991).Google Scholar