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Multilayers by Self-Assembly

Published online by Cambridge University Press:  11 February 2011

M. Toprak
Affiliation:
Dept. of Material Science and Engineering, Royal Institute of Technology, Sweden.
D.K. Kim
Affiliation:
Dept. of Material Science and Engineering, Royal Institute of Technology, Sweden.
M. Mikhaylova
Affiliation:
Dept. of Material Science and Engineering, Royal Institute of Technology, Sweden.
M. Muhammed
Affiliation:
Dept. of Material Science and Engineering, Royal Institute of Technology, Sweden.
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Abstract

Nanoparticles, as building blocks, are important for the development of advanced, functional composite materials. Recent developments have shown that self-assembly of nanoparticles is a promising technique for the fabrication of complicate nanostructured materials. Self assembly of the nanoparticles into ordered structures on a substrate can be achieved through chemical treatment of the particle and/or substrate surface. The assembled nanoparticles can have a dramatic effect on the physical properties of the composite. A μCP technique has been employed to form a SAM of bifunctional silane (APTMS) in the region of contact. The stamps for the μCP are prepared by polymerization of polydimethysiloxane (PDMS) on a flat surface. Glass substrates have been used for optical absorption measurements. Oxide or metallic particles have been assembled on the patterned surface after a surface treatment. The self-assembled layer was subsequently treated with bifunctional molecules and multilayers of the same material or composites have been thus obtained.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1. Westscott, S.L., Oldenburg, S.J., Lee, T. R., Halas, N.J., Langmuir 14, 5396(1998).Google Scholar
2. Sarathy, K.V., John Thomas, P., Kulkarni, G.U., Rao, C.N.R., J. Phys. Chem. B 103, 399(1999).Google Scholar
3. Colvin, V.L., Schlamp, M.C., Alivisatos, A.P., Nature 370, 354(1994).Google Scholar
4. Nakanishi, T., Ohtani, B., Uosaki, K., J. Phys. Chem. B102, 1571(1998).Google Scholar
5. Whetten, R.L. et al. Adv. Mater. 1996, 8, 428.Google Scholar
6. Grabar, K.C., Allison, K.J., Baker, B.E, Langmuir 12, 2353(1996).Google Scholar
7. Kim, D.K. et al., Scripta Mater. 44, 1713(2001).Google Scholar
8. Toprak, M., Zhang, Y., Muhammed, M., Zakhidov, A.A., Baughman, R.H., Khayrullin, I., 18th Int. Conf. on Thermoelectrics, 382(1999).Google Scholar
9. Goldsmid, H.J., Penn, A.W., Phys. Lett. 27A, 523(1968).Google Scholar
10. Bertini, L., Stiewe, C., Toprak, M., Williams, S., Platzek, D., Mrotzek, A., Zhang, Y., Gatti, C., Müller, E., Muhammed, M., Rowe, M., to be published in J. Appl. Phys. Feb. 2003.Google Scholar