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The Morphology of YBa2Cu3O7−x Thin Films Grown on Ceramic Substrates

Published online by Cambridge University Press:  28 February 2011

L. A. Tietz ,
B. C. De Cooman ,
C. B. Carter ,
D. K. Lathrop ,
S. E. Russek  and
R. A. Buhrman
L. A. Tietz
Affiliation:
Department of Materials Science and Engineering, Bard Hall
B. C. De Cooman
Affiliation:
Department of Materials Science and Engineering, Bard Hall
C. B. Carter
Affiliation:
Department of Materials Science and Engineering, Bard Hall
D. K. Lathrop
Affiliation:
School of Applied and Engineering Physics, Clark Hall Cornell University, Ithaca, NY 14853.
S. E. Russek
Affiliation:
School of Applied and Engineering Physics, Clark Hall Cornell University, Ithaca, NY 14853.
R. A. Buhrman
Affiliation:
School of Applied and Engineering Physics, Clark Hall Cornell University, Ithaca, NY 14853.
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Abstract

The microstructure of thin films of the high Tc superconductor YBa2Cu3O7−x deposited on SrTiO3 and Y-stabilized cubic-zirconia (YSZ) single-crystal substrates has been characterized by transmission electron microscopy. Films on both substrates were polycrystalline. On {001 }-oriented SrTiO3, the grains are oriented with <110> normal to the substrate surface. On the same orientation of YSZ, two microstructures are observed: one in which grains have their c-axes normal to the substrate surface, the other in which grains have the a- (or b-) axis normal to the substrate surface. Both of these microstructures contain special grain boundaries. Annealing of ion-milled TEM specimens is presented as a means of removing ion-beam damage.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 719
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

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