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Morphology of a Blend of Zinc Neutralized Sulfonated Poly(Phenylene Oxide) or Polystyrene and an Amino Silicone

Published online by Cambridge University Press:  10 February 2011

Alan A. Jones
Affiliation:
Clark University, Chemistry Department, 950 Main St., Worcester, MA 01610
Paul T. Inglefield
Affiliation:
Clark University, Chemistry Department, 950 Main St., Worcester, MA 01610
Changlai Yang
Affiliation:
Clark University, Chemistry Department, 950 Main St., Worcester, MA 01610
Pamela Bergquist
Affiliation:
Clark University, Chemistry Department, 950 Main St., Worcester, MA 01610
Jiefeng Shi
Affiliation:
W.L. Gore & Associates, Inc., Polymer Products, 1320 Appleton Road, Elkton, MD 21922
Roger P. Kambour
Affiliation:
General Electric Research and Development, Polymer Physics and Engineering, Schenectady, NY, 21301
George D. Wignall
Affiliation:
Oak Ridge National Laboratory, Bethel Valley Road, Oak Ridge, TN, 37831
Henri-Noel Migeon
Affiliation:
Centre Univeristaire, Laboratoire D'Analyse Des Matériaux, 162a Avenue de la Faïencerie, Luxembourg City L-1511, Luxembourg
Jean-Paul Martin
Affiliation:
Centre Univeristaire, Laboratoire D'Analyse Des Matériaux, 162a Avenue de la Faïencerie, Luxembourg City L-1511, Luxembourg
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Abstract

A polymer blend of an ionomer based on zinc neutralized sulfonated poly(phenylene oxide) or polystyrene with a silicone copolymer containing 6.45% propylamine groups in place of one of the methyl groups on a backbone silicon was prepared. Carbon-13 magic angle spinning spectra show coordination of the amine by the zinc ions. Morphological characterization was made by NMR spectroscopy based on proton spin diffusion, by small angle x-ray scattering and by energy filtered transmission electron microscopy. All experiments show domains in the range of 1 to 1000 nm and domain size can be controlled by the extent of coordination of the amine groups by the zinc ions and by thermal history. The different morphological experiments lead to an apparent hierarchy of domain sizes. The NMR experiment yields the smallest domains, 2 to 10 nm, where contrast is produced by differences in chain mobility. Small angle x-ray scattering indicates domains of 16 nm while electron microscopy indicates domains in the range of 100 to 1000 nm. The variation of the domain size between experiments may reflect the different sources of contrast in each case.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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