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Morphological Stability of Semicoherent Solid-Solid Interfaces: a Simple Model

Published online by Cambridge University Press:  15 February 2011

Craig Rottman*
Affiliation:
North Dakota State University, Department of Physics, Fargo, ND 58105-5566
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Abstract

The stability of semicoherent interfaces between two solids with small lattice mismatch is examined. I consider the cases in which the rotation θ between the two solids is both zero and small. The interface orientation, characterized by a single angle φ, is arbitrary. The interfaces are composed of regularly spaced misfit dislocations, steps, and lattice dislocations. For a wide range of φ, many flat interfaces are unstable with respect to breaking up into two interfaces of distinct orientations, one of which contains only one of the two types of dislocations possible.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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