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MONTE CARLO STABILITY ANALYSIS OF STRAINED LAYER SUPERLATTICE INTERFACES

Published online by Cambridge University Press:  28 February 2011

BRIAN W. DODSON
BRIAN W. DODSON*
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
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Abstract

We have developed a procedure, based on conventional Monte Carlo methods, to investigate the limits of stability of a strained layer superlattice (SLS) system as a function of lattice mismatch and layer thickness. The method is demonstrated by the analysis of two-dimensional Lennard-Jones SLS systems, for which the regime of absolute SLS stability is mapped out. Extension of the technique to three-dimensional silicon-like model systems is discussed, and appropriate model potentials for stability analysis of the Si/SiGe system are introduced.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 56: Symposium H – Layered Structures and Epitaxy , 1985 , 371
Copyright
Copyright © Materials Research Society 1986

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References

1. Osbourn, G.C., J Appl Phys 53, 1586 (1982).Google Scholar
2. Dodson, B.W., in Layered Structures, Epitaxy, and Interfaces, Gibson, J.M. and L.R. Dawson eds., (MRS, Pittsburgh, 1955).Google Scholar
3. Harrison, W.A., Electronic Structure and the Properties of Solids, Ch 8 (Freeman, San Fransisco, 1980).Google Scholar
4. Stillinger, F.H. and Weber, T.A., Phys Rev B 31, 5262 (1985).Google Scholar
5. Dodson, B.W. and Taylor, P.A., in Proceedings of Symposium R, MRS 1985 Fall Meeting (1986).Google Scholar