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Published online by Cambridge University Press: 28 February 2011
We have developed a procedure, based on conventional Monte Carlo methods, to investigate the limits of stability of a strained layer superlattice (SLS) system as a function of lattice mismatch and layer thickness. The method is demonstrated by the analysis of two-dimensional Lennard-Jones SLS systems, for which the regime of absolute SLS stability is mapped out. Extension of the technique to three-dimensional silicon-like model systems is discussed, and appropriate model potentials for stability analysis of the Si/SiGe system are introduced.