Published online by Cambridge University Press: 10 February 2011
New precursors were developed for the chemical vapor deposition (CVD) of aluminum nitride (AIN) and gallium nitride (GaN) at low temperatures. Synthetic methods for the new materials will be reported, along with their analyses and spectral characterization. The precursors are volatile (180 mTorr at 45-55 °C), low-viscosity (10 centipoise) liquids, so they are more convenient as vapor sources than previously available solid sources. They are thermally stable to temperatures well above their vaporization temperatures, so their vaporization is highly reproducible and leaves no residue. Unlike previously available liquid precursors, they are not pyrophoric, so they are safer to handle. AMN films formed by reaction with ammonia at around 200 °C are amorphous, transparent insulators that are good barriers to diffusion of water, oxygen, and other materials.