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Modeling of Nanophase Connectivity in Substance-Void Composite by Oblique Deposition

Published online by Cambridge University Press:  25 February 2011

T. Motohiro ,
S. Noda ,
A. Isogai  and
O. Kamigaito
T. Motohiro
Affiliation:
Toyota Central Research & Development Laboratories, Inc., 41–1, Nagakute-cho, Aichi-gun, Aichi-ken, 480–11, Japan
S. Noda
Affiliation:
Toyota Central Research & Development Laboratories, Inc., 41–1, Nagakute-cho, Aichi-gun, Aichi-ken, 480–11, Japan
A. Isogai
Affiliation:
Toyota Central Research & Development Laboratories, Inc., 41–1, Nagakute-cho, Aichi-gun, Aichi-ken, 480–11, Japan
O. Kamigaito
Affiliation:
Toyota Central Research & Development Laboratories, Inc., 41–1, Nagakute-cho, Aichi-gun, Aichi-ken, 480–11, Japan
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Abstract

Obliquely vapor deposited thin film is characterized by its unique inclined columnar structure. Recently one of the authors developed thin film optical quarter-wave plate by oblique deposition. SEM observation revealed the inclined columns of ∼10 nm in diameter and ∼3 microns in length. Its birefringence indicates those columns are less closely spaced in the plane of vapor incidence (PVI) than normal to PVI, composing alternatively stacked substance layer (columns laterally connected with each other)-void layer(residual space) nanophase composite with 2–2 connectivity. The growth mechanism of the inclined columnar structure has been successfully explained by the self-shadowing effect in 2D-space computer simulation in PVI. However, the connectivity development perpendicular to PVI is not self-evident. In the present work, we performed simple 3D-space simulation of oblique depositipon and observed substantial feature of the connectivity development and related features on this nanophase structure.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 159: Symposium C – Atomic Scale Structure of Interfaces , 1989 , 419
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Panel Report on Clusters and Cluster-Assembled Materials, Monterey, California, January 1988, Council on Materials Science, Division of Material Science, U.S. Department of Energy.Google Scholar
2. Wang, Y. and Herron, N., J. Phys. Chem. 91, 257 (1987).Google Scholar
3. Motohiro, T. and Taga, Y., Applied Optics 28, 2466 (1989).Google Scholar
4. Keitoku, S. and Nishioka, K., Jap. J. Appl. Phys. 20, 1249 (1981).Google Scholar
5. Dirks, A. G. and Leamy, H. J., Thin Solid Films 47, 219 (1977).Google Scholar
6. Newham, R. E., Skinner, D. P. and Cross, L. E., Mat. Res. Bull. 13, 525 (1978), Pergamon Press, USA.Google Scholar
7. Motohiro, T. and Taga, Y., Thin Solid Films 72, L71 (1989).Google Scholar
8. Born, M. and Wolf, E., Pronciples of Optics, third ed., Pergamon, Oxford, (1965), p. 705.Google Scholar
9. Henderson, D., Brodsky, M. H. and Chaudhari, P., Appl. Phys. Lett., 25, 641 (1974).Google Scholar