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Microstructures of Luminescent nc-Si by Excimer Laser Annealing of a-Si:H
Published online by Cambridge University Press: 15 February 2011
Abstract
We have reported for the first time on visible photoluminescence (PL) in crystallized a-Si:H/a-SiNx:H multilayer structures by CW Ar ion laser annealing treatments. In this paper we present new results on visible PL from crystallized a-Si:H by using KrF excimer pulse laser (wavelength 248 nm) irradiating treatments. The transmission electron microscopy and Raman scattering studies reveal the microstructures of crystallized Si films, which depend on the pulse number and the pulse energy density of KrF laser. When the laser pulse energy density is higher than 520 mJ/cm2, the nanosized Si crystallites (nc-Si) can be formed from a-Si:H layers with a thickness of 100 nm and strong PL with a peak wavelength of 610 nm has been observed at room temperature.
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- Copyright © Materials Research Society 1997
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