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Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure

Published online by Cambridge University Press:  01 February 2011

Jens Müller
Affiliation:
[email protected], NIST Boulder, Materials Reliability Division, 325 Broadway, Boulder, Colorado, 80305-3328, United States, 303-497-7065, 303-497-5030
Stephanie A. Hooker
Affiliation:
[email protected], NIST Boulder, Materials Reliability Division, United States
Davor Balzar
Affiliation:
[email protected], University of Denver, Department of Physics and Astronomy, United States
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Abstract

In this study, multilayered PbTixZr1-xO3 (PZT) samples (produced at sintering temperatures in the range of 1175 °C to 1325 °C) were electrically fatigued by long-term exposure (∼106 cycles) to electric fields, and the parameters of initial and remnant polarization were estimated. Changes in the crystallographic microstructure as a function of sintering temperature Ts were examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) to gain insight on fatigue mechanisms and their prevention. Results showed that domain wall movement was facilitated in samples processed at TS less than 1250 °C, and that such samples were more resistant to electrical fatigue.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

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