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Microstructure Studies on Hexagonal Layered Ni-S Nanocrystals

Published online by Cambridge University Press:  01 February 2011

Xiang-Cheng Sun ,
J. Reyes-Gasga  and
J. A. Toledo
Xiang-Cheng Sun
Affiliation:
Center for Material for Information Technology, The University of Alabama, Tuscaloosa, Alabama 35487-0209. Tel: 205-348-280, Fax: 205-348-2346,*Email:[email protected]
J. Reyes-Gasga
Affiliation:
Institute of Physics, National University of Mexico, 04250, D.F. Mexico
J. A. Toledo
Affiliation:
Molecular Engineer, Instituto Mexicano del Petroleo, 07730, D.F. Mexico
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Abstract

Layered nickel-sulfides (Ni-S) nanocrystals had been successfully prepared by lowtemperature hydrothermal approach. Rietveld X-ray diffraction (XRD) analysis revealed that these layered Ni-S materials have two different hexagonal structure phases, NiS1.03 and NiS, both phases are NiAs-type with space group of P63/mmc. X-ray energy dispersive spectra (XEDS) analysis and TEM observations also confirmed these two nanocrystals of NiS1.03 and NiS. High-resolution transmission electron microscopy (HREM) lattice images indicated moiré fringes with rotational or translational patterns were observed in these layered Ni-S nanophases materials. In particular, it was found that all the simulated HREM images were in good agreement with the observed HREM lattice images. Especially, the simulated SAED patterns obtained from the hexagonal Ni-S crystallographic model showed that the experimental SAED patterns taken along [11.0], [00.1] and [10.0] zone axes presented reflections produced by double diffraction effect.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 727: Symposium R – Nanostructured Interfaces , 2002 , R4.2
Copyright
Copyright © Materials Research Society 2002

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