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Microstructure of Polycrystalline Sic Containing Excess Si after Neutron Irradiation

Published online by Cambridge University Press:  15 February 2011

S.D. Harrison  and
J.C. Corelli
S.D. Harrison
Affiliation:
Dept. Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181 USA
J.C. Corelli
Affiliation:
Dept. Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181 USA
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Abstract

The microstructure of commercially available reactionbonded polycrystalline SiC containing 8–10 wt% excess silicon was studied after irradiation by reactor neutrons uitlizing transmission electron microscopy (TEM) and scanning electron microscopy (SEM). For TEM studies on samples irradiated below 473°K we observe dislocation tangles near grain boundaries or impurities plus isolated dislocations throughout the remainder of the grain, whereas for irradiation temperatures of ≈3730°K the material exhibits copious quantities of “black spot” defects (2–5nm size) and a lower concentration of tangles than 473°K irradiation. The SEM studies of surfaces of samples fractured at 1473°K indicate that the mode of fracture is predominantly transgranular.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 2: Symposium – Defects in Semiconductors I , 1980 , 527
Copyright
Copyright © Materials Research Society 1981

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References

REFERENCES

1. Rovner, L.H. and Hopkins, G.H., Nucl. Tech. 29, 274 (1976).CrossRefGoogle Scholar
2. Price, R.J., J. Nucl. Mat. 33, 17 (1969).Google Scholar
3. Matthews, R.B., J. Nucl. Meth. 51, 203 (1974).Google Scholar
4. Blackstone, R. and Voice, E.H., J. Nucl. Tech. 39, 319 (1971).Google Scholar
5. Matheny, R.M., Corelli, J.C. and Trantina, G.G., J. Nucl. Mat. 83, 313 (1979).CrossRefGoogle Scholar
6. Price, R.J., J. Nucl. Mat. 48, 47 (1973).Google Scholar
7. Sawyer, G.R. and Page, T.F., J. Mat. Sci., 13, 889 (1978).CrossRefGoogle Scholar
8. Torti, M.L., Lucek, J.W. and Weaver, G.Q., Article 780071, Soc.of Auto.Engs. Inc.,SAW Cong. & Expo., Feb. 27-March 3, 1978, Detroit, Michigan.Google Scholar
9. Smith, D.J., Jepps, N.W. and Page, T.F., J. of Microscopy 114, 1 (1978).Google Scholar
10. Herrer, A.H., Fryburg, G.A., Ogbiyi, L.N., Mitchell, T.E. and Shinozaki, S., J. Am. Cer. Soc., 61 406 (1978).CrossRefGoogle Scholar
11. Price, R.J., Nucl. Tech. 35, 320 (1977).Google Scholar
12. Malloy, J.W., Fulop, L. and Corelli, J.C.,Bull.Am.Phys.Soc. 25,#3,178 (1980).Google Scholar