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The Microstructure of Fe7C3 Formed at 300°C by Plasma Enhanced Chemical Vapor Deposition (PECVD)

Published online by Cambridge University Press:  03 September 2012

H. Siriwardane
Affiliation:
Departments of Physics, University of Missouri-Rolla, Rolla, MO 65401 (U.S.A.).
P. Fraundorf
Affiliation:
Department of Physics, University of Missouri-St. Louis, St. Louis, MO 63121 (U.S.A.).
J.W. Newkirk
Affiliation:
Departments of Metallurgical Engineering, and University of Missouri-Rolla, Rolla, MO 65401 (U.S.A.).
O.A. Pringle
Affiliation:
Departments of Physics, University of Missouri-Rolla, Rolla, MO 65401 (U.S.A.).
W.J. James
Affiliation:
Departments of Chemistry and the Graduate Center for Material Research, University of Missouri-Rolla, Rolla, MO 65401 (U.S.A.).
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Extract

Thin iron carbide films were prepared by introducing iron penta carbonyl (FeCO5) and hydrogen (H2) into a glow discharge. The films are of potential interest in corrosion and wear resistant applications. X-ray diffraction data of films (≈ 7000 Å thick) deposited on glass at 300°C evidenced only Fe7C3. Thinner films were required for examination by analytical and high resolution transmission electron Microscopy. Therefore, two sets of films (“thin” < 200 Å and “thick” ≈ 800 Å) were plasma-deposited on carbon or holey carbon films supported on copper grids. The thin TEM specimens exhibited a fine texture and gave rise to ring diffraction patterns, whereas the thick TEM specimens evidenced two types of structure: (i) half-Micron sized grains separated from one another by 1–2 Microns on the support, although sometimes interconnected by single crystal platelets and (ii) 300 Å grapelike clumps of 100–200 Å crystals, each individually surrounded by a 50 Å non-crystalline coating. The latter structure may result from a post-formation oxidation process which expels carbon from the iron phase into grain boundaries.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Blocher, J. M. Jr, J. Vac. Sci. Technol. 11, 680 (1974).Google Scholar
2. Thornton, J. A., Ann. Rev. Mater. Sci. 7, 239 (1977).Google Scholar
3. Bunshah, R. F., Vacuum 27, 353 (1977).Google Scholar
4. Hentzell, H. T. G., Grovenor, C. R. M. and Smith, D. A., J. Vac. Sci. Technol A2, 218 (1984)Google Scholar
5. Winters, H. F. and Sigmund, P., J. Appl. Phys. 54, 4760 (1974).Google Scholar
6. Veprek, S., Thin Solid Films 97, 17 (1982).Google Scholar
7. Li, J. L., James, W. J. and O'Keefe, T. J., Mat. Sci. Eng. B7, 359 (1990); 15 (1990).Google Scholar
8. Siriwardane, H., James, W. J., Pringle, O. A. and Newkirk, J., submitted to Scripta Met.Google Scholar
9. Siriwardane, H., Newkirk, J., James, W. J. and Pringle, O. A., submitted to Thin Solid Films.Google Scholar
10. Siriwardane, H., Howard, S. A., Pringle, O. A. and James, W. J., Conf. App. X-Ray Anal., Session D-4, (1992).Google Scholar
11. Siriwardane, H., James, W.J., Pringle, O. A., and Newkirk, J.W., submitted to Mat. Res. Soc. Symp. Proc.Google Scholar
12. Fraundorf, P. and Keefe, G., Micron 13, 49 (1982).Google Scholar
13. Tajima, Shin and Hirano, Shin-ichi, Jpn. J. Appl. Phys. 29, 662 (1990).Google Scholar
14. Pringle, O. A., Long, G. J., Li, J. L., James, W. J., Grandjean, F. and Hadjipanayis, G. C., IEEE Trans. Maen. 28, 2862 (1992).Google Scholar
15. Caray, W., Zinne, E., Fraundorf, P. and Lewis, R. S., Meterotics 22, 349 (1987).Google Scholar
16. Bourret, A., Thibault-Desseaux, J. and Seidman, D. N., J. Appl. Phys. 55, 825 (1984).Google Scholar
17. Buseck, P. R. and Bo-Jun, H., Geochimica et Cosmochimica Acta 49, 2003 (1985).Google Scholar
18. Rietmeijer, F. J. M. and Mackinnon, I. D.R., Nature 315, 733 (1985).Google Scholar