Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-25T15:35:21.722Z Has data issue: false hasContentIssue false

Microstructure Characterization of Textured Materials Considering Extinction Phenomenon

Published online by Cambridge University Press:  01 February 2011

T. Kryshtab
Affiliation:
Instituto Politécnico Nacional-ESFM, Av. IPN, Ed. 9, U.P.A.L.M., 07738, México, D. F. México
A. Cadena Arenas
Affiliation:
Instituto Politécnico Nacional-ESFM, Av. IPN, Ed. 9, U.P.A.L.M., 07738, México, D. F. México
G. Gómez Gasga
Affiliation:
Instituto Politécnico Nacional-ESFM, Av. IPN, Ed. 9, U.P.A.L.M., 07738, México, D. F. México
A. De Ita de la Torre
Affiliation:
Area of Material Science, UAM-Unidad Azcapotzalco, Av. San Pablo #180, 02200, México, D. F., México
A. Kryvko
Affiliation:
Instituto Politécnico Nacional-ESIME Zacatenco, Av. IPN, Ed. 5, U.P.A.L.M., 07360, México, D.F. México. E-mail: [email protected], [email protected]
Get access

Abstract

Texture is defined by the measured polar figure (PF) obtained from the integrated intensity of diffracted X-rays. The integrated intensity can be affected both by the pole density (PD) and by the phenomenon of extinction that reduces the PD and cannot be avoided. PF does not contain information about grain microstructure, but parameters of the primary and secondary extinction are related to the crystal microstructural features. Recently an original X-ray diffraction method was proposed for correction of PD and separation and determination of the primary and secondary extinction parameters for characterization of textured aluminum samples. This problem was solved using some assumptions. The parameter of the primary extinction can be used for calculation of domain size. The secondary extinction parameter is related to the average domain disorientation angle that depends on dislocation density in domain boundaries. Extinction parameters were used for microstructure evaluation of cold rolled nickel with and without annealing at 600°C. The validity of the proposed assumption for nickel samples was evaluated in terms of the extinction length. The corrected pole density and the parameters of primary and secondary extinction were calculated using the first order reflection for two different wavelengths (Cu and Co) and the second order reflection for one of the used wavelengths. In annealed samples the primary and secondary extinction were presented simultaneously. According to the obtained parameters of extinction the microstructure of textured nickel was evaluated.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kocks, U. F., Tomé, C.N. and Wenk, H. R., Texture and Anisotropy, Cambridge University Press (1998).Google Scholar
2. Randle, V. and Engler, O.. Introduction to Texture Analysis Macrotexture, Microtexture and Orientation Mapping, Gordon and Beach Science Publisher, Amsterdam (2000).Google Scholar
3. Krivoglaz, M.A., X-Ray and Neutron Scattering in Nonideal Crystals (Springer Verlag, Berlin–Heidelberg - New York), (1996) p. 466.Google Scholar
4. Authier, A., Balibar, F., and Epelboin, Y., Phys. Stat. Sol. 41, 225(1970).Google Scholar
5. Indenbom, V.L. and Kaganer, V.M., Phys. Stat. Sol. (a) 87, 253(1985).Google Scholar
6. Kryshtab, T., Palacios-Gomez, J., Mazin, M., and Gomez-Gasga, G., Acta Materialia 52/10 3027 (2004).Google Scholar
7. James, R.W., The Optical Principles of the Diffraction of X-Rays (3rd ed. London: G., Bell), (1965) p. 664.Google Scholar
8. Zachariasen, W.H., Acta Cryst. 16, 1139 (1963).Google Scholar
9. Zachariasen, W.H., Acta Cryst. 23, 558 (1967).Google Scholar
10. Pinsker, Z.G., Dynamical Scattering of X-Rays in Crystals (Springer-Verlag, Berlin- Heidelberg - New York), (1978) p. 511.Google Scholar
11. International Tables for X-ray Crystallography (Dordrecht, Boston, London: Kluwer Acad. Publ.), (1992).Google Scholar
12. Larson, I. A. and Corey, C.L., J. Appl. Phys. 40, 2708 (1969).Google Scholar