Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-29T09:53:50.020Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructural Evolution of Ba2Ycu3O7 Superconductor by Electron Irradiation in a Transmission Electron Microscope

Published online by Cambridge University Press:  28 February 2011

Kensuke ShiraiShi  and
Hiroshi Itoh
Kensuke ShiraiShi
Affiliation:
Takasaki Radiation Chemistry Research Establishment, Japan Atomic Energy Research Institute, Watanuki‐machi, Takasaki, Gunma 370‐12, Japan
Hiroshi Itoh
Affiliation:
Takasaki Radiation Chemistry Research Establishment, Japan Atomic Energy Research Institute, Watanuki‐machi, Takasaki, Gunma 370‐12, Japan
Get access

Abstract

Microstructural changes in a Ba2YCu3O7 pellet were continuously observed during electron irradiation in a transmission electron microscope operating at 200 kV. Twin lamellae of 2~10 nm in thickness with 1~50 nm spacings were seen parallel to the lattice image of (001) plane with 1.17 nm in lattice spacing. The tip of the twin was lenticular and the (001) lattice fringes were distorted around the tip. Upon intense electron beam illumination, the lamellae faded at the tip and the thickness gradually decreased which increased the spacing in the high density region. Defect clusters of about 10 nm in size were produced in the very early stage of electron illumination.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 835
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Shiraishi, K., Itoh, H. and Yoda, O., Jpn. J. Appl. Phys. 21, L2339 (1988); K. Shiraishi, T. Kato and J. Kuniya, ibid., 18, L807 (1989).Google Scholar
2 Eaglesham, D.J., Humphreys, C.J., Alford, N. McN., Clegg, W.J., Harmer, M.A. and Birchall, J.D., Appl. Phys. Lett. 51, 457 (1987).Google Scholar
3 Kirk, M.A., Baker, M.C., Liu, J.Z., Lam, D.J. and Weber, H.W. in High Temperature Superconductors, edited by Brodsky, M.B., Dynes, R.C., Kitazawa, K. and Tuller, H.L. (Mater. Res. Soc. Proc. 39, Pittsburgh, PA 1988) pp. 209‐214.Google Scholar
4 Mitchell, T.E., Roy, T., Schwarz, R.B., Smith, J.F. and Wohlleben, D., J. Electron Microsc. Technique 8, 317 (1988).Google Scholar
5 Barry, J.C., ibid., 8, 325 (1988).Google Scholar
6 Lin, W.T., Chu, H.C., Chen, B.H., Chang, Y.H., Chin, T.S. and Wu, P.T., in High Temperature Superconductors, edited by Brodsky, M.B., Dynes, R.C., Kitazawa, K. and Tuller, H.L. (Mater. Res. Soc. Proc. 99, Pittsburgh, PA 1988) pp. 927‐930 .Google Scholar
7 Matsui, Y., Takayama‐Muromachi, E. and Kato, K., Jpn. J. Appl. Phys. 26 L1183 (1987).Google Scholar
8 Nastasi, M., Parkin, D.M., Zocco, T.G., Koike, J. and Okamoto, P.R., Appl. Phys. Lett. 53, 1326 (1988).Google Scholar
9 Shiraishi, K., Itoh, H. and Yoda, O., Jpn. J. Appl. Phys. 28, L409 (1989).Google Scholar
10 Roas, B., Hensel, B. and Saemann‐Ischenko, G. and Schultz, L., Appl. Phys. Lett. 54, 1051 (1989).Google Scholar
11 Bourgault, D., Bouffard, S., Toulemonde, M. Groult, D., Provost, J., Studer, F., Nguyen, N. and Raveau, B., Phys. Rev. B 39, 6549 (1989).Google Scholar