Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-29T07:55:25.077Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructural Changes Due to Process Conditions in Sol-Gel Derived KNbO3 Thin Films

Published online by Cambridge University Press:  21 February 2011

G.J. Derderian ,
J.D. Barrie ,
K.A. Aitchison ,
P.M. Adams  and
M.L. Mecartney
G.J. Derderian
Affiliation:
Mechanics and Materials Technology Center, The Aerospace Corporation, M2/248, P.O. Box 92957, Los Angeles, CA 90009 Materials Science and Engineering / Department of Mechanical and Aerospace Engineering, University of California at Irvine, Irvine CA 92717
J.D. Barrie
Affiliation:
Mechanics and Materials Technology Center, The Aerospace Corporation, M2/248, P.O. Box 92957, Los Angeles, CA 90009
K.A. Aitchison
Affiliation:
Mechanics and Materials Technology Center, The Aerospace Corporation, M2/248, P.O. Box 92957, Los Angeles, CA 90009
P.M. Adams
Affiliation:
Mechanics and Materials Technology Center, The Aerospace Corporation, M2/248, P.O. Box 92957, Los Angeles, CA 90009
M.L. Mecartney
Affiliation:
Materials Science and Engineering / Department of Mechanical and Aerospace Engineering, University of California at Irvine, Irvine CA 92717
Get access

Abstract

KNbO3 thin films have been deposited from K(OMe)/Nb(OMe)5 sols onto (100) MgO substrates. Microstructural changes were observed relative to stoichiometry, aging, and the hydrolysis temperature. The production of single phase, oriented films has been demonstrated, and was found to be strongly dependent on process conditions. The films were characterized by XRD, TEM, SEM, EDS, and Raman spectroscopy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 310: Symposium N – Ferroelectric Thin Films III , 1993 , 339
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Holman, R.L., Johnson, L.M. Althouse, Skinner, D.P., Proceedings of the Sixth IEEE Int. Symp. on AppI. of Ferroelectrics. 1986, 32–41.Google Scholar
2. Gunter, P., Phys. Rep., 93 (4), 199–299, (1982).Google Scholar
3. Tuttle, B.A., Mat. Res. Soc. Bull., 12 (7), 40–45, (1987).CrossRefGoogle Scholar
4. Kingon, A.I., Auciello, O.H., Auciello, M.S., Ameen, M.S., Rou, S.H., and Krauss, A.R., Appl. Phys. Lett., 55, 301, (1989).Google Scholar
5. Amini, M.M. and Sacks, M.D., J. Am. Ceram. Soc., 74 (1), 53–59, (1991).Google Scholar
6. Tuttle, B.A., Bunker, B.D., Lamppa, D.L., Tissot, R.G., and Yio, J.L., Ceram. Trans.,11, 329–41, (1990).Google Scholar
7. Swartz, S.L., Melling, P.J., and Grant, C.S., Mat. Res. Soc. Proc., 152, (1989).Google Scholar
8. Fathi, I.A. and Clark, D.E., Mat. Res. Soc. Symp. Proc., 180, 401–06, (1990).Google Scholar
9. Xu, Y. and Mackenzie, J.D., Integrated Ferroelectrics, 1, 17–42, (1992).Google Scholar
10. Ulrich, D.R., J. of Non-Crystalline Solids, 100, 174–193, (1988).Google Scholar
11. Graettinger, T.M., Rou, S.H., Ameen, M.S., Auciello, O., and Kingon, A.I., Appl. Phys. Lett., 58 (18), 1964–1966, (1991).Google Scholar