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A Microscopic Marker Technique For Documenting Interface Motion in Corrosion Scales Using TEM

Published online by Cambridge University Press:  21 February 2011

Shou-Kong Fan  and
Linn W. Hobbs
Shou-Kong Fan
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139 now at Texas Instruments, Inc., P.O. Box 655621, Dallas, TX 75265
Linn W. Hobbs
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139
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Abstract

We report here on a microscopic marker technique designed for use with cross-section TEM examination of corrosion scales. The technique involves microphotolithographic methods for sputter deposition of inert markers and has been used to document substrate/scale interface motion during high-temperature oxidation of Ni and Ni-base alloys.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 283
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Smielgas, A. and Kirkendall, E., Trans. AIME 171, 130 (1947); J. A. Sartell and C. H. Li, J. Inst. Metals 90, 92 (1961).Google Scholar
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