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Microscopic Characterizations of Nanostructured Silicon Thin Films for Solar Cells

Published online by Cambridge University Press:  12 July 2011

Antonín Fejfar ,
Petr Klapetek ,
Jakub Zlámal ,
Aliaksei Vetushka ,
Martin Ledinský  and
Jan Kočka
Antonín Fejfar
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
Petr Klapetek
Affiliation:
Czech Metrology Institute, Okružní 31, 638 00 Brno, Czech Republic
Jakub Zlámal
Affiliation:
Brno University of Technology, Technická 2, 616 69 Brno, Czech Republic
Aliaksei Vetushka
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
Martin Ledinský
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
Jan Kočka
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
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Abstract

Microscopic characterization of mixed phase silicon thin films by conductive atomic force microscopy (C-AFM) was used to study the structure composed of conical microcrystalline grains dispersed in amorphous matrix. C-AFM experiments were interpreted using simulations of electric field and current distributions. Density of absorbed optical power was calculated by numerically solving the Maxwell equations. The goal of this study is to combine both models in order to simulate local photoconductivity for understanding the charge photogeneration and collection in nanostructured solar cells.

Keywords

Simicrostructurescanning probe microscopy (SPM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1321: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology , 2011 , mrss11-1321-a15-01
Copyright
Copyright © Materials Research Society 2011

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References

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