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Microscopic Characterizations of Nanostructured Silicon Thin Films for Solar Cells

Published online by Cambridge University Press:  12 July 2011

Antonín Fejfar ,
Petr Klapetek ,
Jakub Zlámal ,
Aliaksei Vetushka ,
Martin Ledinský  and
Jan Kočka
Antonín Fejfar
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
Petr Klapetek
Affiliation:
Czech Metrology Institute, Okružní 31, 638 00 Brno, Czech Republic
Jakub Zlámal
Affiliation:
Brno University of Technology, Technická 2, 616 69 Brno, Czech Republic
Aliaksei Vetushka
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
Martin Ledinský
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
Jan Kočka
Affiliation:
Institute of Physics of the Academy of Sciences of the Czech Republic, v.v.i, Cukrovarnická 10, 162 00 Prague 6, Czech Republic
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Abstract

Microscopic characterization of mixed phase silicon thin films by conductive atomic force microscopy (C-AFM) was used to study the structure composed of conical microcrystalline grains dispersed in amorphous matrix. C-AFM experiments were interpreted using simulations of electric field and current distributions. Density of absorbed optical power was calculated by numerically solving the Maxwell equations. The goal of this study is to combine both models in order to simulate local photoconductivity for understanding the charge photogeneration and collection in nanostructured solar cells.

Keywords

Simicrostructurescanning probe microscopy (SPM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1321: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology , 2011 , mrss11-1321-a15-01
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Teplin, C. W., Jiang, C.-S., Stradins, P., and Branz, H. M., Appl. Phys. Lett. 92, 093114–3 (2008).10.1063/1.2891087Google Scholar
2. Fejfar, A., Mates, T., Čertík, O., Rezek, B., Stuchlík, J., Pelant, I., and Kočka, J., J. Non-Cryst. Sol. 338–340, 303–309 (2004).10.1016/j.jnoncrysol.2004.02.063Google Scholar
3. Mates, T., Bronsveld, P. C. P., Fejfar, A., Rezek, B., Kočka, J., Rath, J. K., and Schropp, R. E. I., J. Non-Cryst. Sol. 352, 1011–1015 (2006).10.1016/j.jnoncrysol.2005.10.058Google Scholar
4. Fejfar, A., Mates, T., Honda, S., Rezek, B., Stuchlík, J., Kočka, J., Matějková, J., Hrnčiřík, P., and Valenta, J., in Proceedings of the 19th Europ. Photovoltaic Solar Energy Conference, 7-11 June 2004, Paris, edited by Hoffmann, W., Bal, J. L., Ossenbrink, H., Palz, W., and Helm, P. (WIP-Munich and ETA-Florence, Munich 2004, 2004), pp. 1564–1566.Google Scholar
5. Rockstuhl, C., Lederer, F., Bittkau, K., and Carius, R., Appl. Phys. Lett. 91, 171104 (2007).10.1063/1.2800374Google Scholar
6. Teichert, C. and Beinik, I., in Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 (Springer, 2011), pp. 691–721.Google Scholar
7. Rezek, B., Stuchlík, J., Fejfar, A., and Kočka, J., Appl. Phys. Lett. 74, 1475–1477 (1999).10.1063/1.123585Google Scholar
8. Rezek, B., Stuchlik, J., Fejfar, A., and Kočka, J., J. Appl. Phys. 92, 587–593 (2002).10.1063/1.1486032Google Scholar
9. Vetushka, A., Fejfar, A., Ledinsky, M., Rezek, B., Stuchlik, J., and Kočka, J., Phys. Rev. B 81, 237301 (2010).Google Scholar
10. Čermák, J., Rezek, B., Cimrová, V., Výprachtický, D., Ledinský, M., Mates, T., Fejfar, A., and Kočka, J., Phys. Stat. Sol.(RRL) 1, 193–195 (2007).10.1002/pssr.200701131Google Scholar
11. Ledinský, M., Vetushka, A., Stuchlík, J., Mates, T., Fejfar, A., Kočka, J., and Štěpánek, J., J. Non-Cryst. Sol. 354, 2253–2257 (2008).10.1016/j.jnoncrysol.2007.09.073Google Scholar
12. Vetushka, A., Ledinský, M., Stuchlík, J., Mates, T., Fejfar, A., and Kočka, J., J. Non-Cryst. Sol. 354, 2235–2237 (2008).10.1016/j.jnoncrysol.2007.09.072Google Scholar
13. Ledinský, M., Vetushka, A., Stuchlík, J., Fejfar, A., and Kočka, J., Phys. Status Solidi (c) 7, 704–707 (2010).Google Scholar
14. Fejfar, A., Vetushka, A., Kalusová, V., Certík, O., Ledinský, M., Rezek, B., Stuchlík, J., and Kocka, J., Phys.Status Solidi (a) 207, 582–586 (2010).Google Scholar
15. Multiphysics Modeling and Simulation Software - COMSOL (2005), see also http://www.comsol.com/.Google Scholar
16. Karban, P., Mach, F., and Čertík, O., Agros 2D, Hpfem.org: Free Adaptive hp-FEM (2009), see also http://hpfem.org/agros2d/.Google Scholar
17. Hamadani, B. H., Jung, S., Haney, P. M., Richter, L. J., and Zhitenev, N. B., Nano Letters 10, 1611–1617 (2010).10.1021/nl9040516Google Scholar
18. Ledinský, M., Fekete, L., Stuchlík, J., Mates, T., Fejfar, A., and Kočka, J., J. Non-Cryst. Sol. 352, 1209–1212 (2006).10.1016/j.jnoncrysol.2005.10.072Google Scholar
19. Shah, A. V., Schade, H., Vanecek, M., Meier, J., Vallat-Sauvain, E., Wyrsch, N., Kroll, U., Droz, C., and Bailat, J., Progress in Photovoltaics: Research and Applications 12, 113–142 (2004).10.1002/pip.533Google Scholar
20. Vanecek, M., Poruba, A., Remes, Z., Rosa, J., Kamba, S., Vorlíček, V., Meier, J., and Shah, A., Journal of Non-Crystalline Solids 266–269, 519–523 (2000).10.1016/S0022-3093(99)00804-2Google Scholar
21. Vanecek, M. and Poruba, A., in Properties and Applications of Amorphous Materials(Kluwer Academic Publishers, 2001), pp. 401–433.10.1007/978-94-010-0914-0_24Google Scholar
22. Klapetek, P., Valtr, M., Poruba, A., Necas, D., and Ohlídal, M., Applied Surface Science 256, 5640–5643 (2010).10.1016/j.apsusc.2010.03.028Google Scholar
23. Gotoh, T., Yamamoto, Y., Shen, Z., Ogawa, S., Yoshida, N., Itoh, T., and Nonomura, S., Jpn. J. Appl. Phys. 48, 091202 (2009).10.1143/JJAP.48.091202Google Scholar
24. Kawai, M., Kawakami, T., Inaba, T., Ohashi, F., Natsuhara, H., Itoh, T., and Nonomura, S., Current Applied Physics 10, S392–S394 (2010).10.1016/j.cap.2010.02.020Google Scholar