Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-27T02:21:58.115Z Has data issue: false hasContentIssue false

Micro-Raman Cross-Section Study of Ordered Porous III-V Semiconductor Layers

Published online by Cambridge University Press:  12 March 2013

Tetyana R. Barlas
Affiliation:
Institute for Physics of Semiconductors, National Academy of Sciences of Ukraine, 45 Nauki Prospect, 03028 Kyiv, Ukraine ,
Nicolas L. Dmitruk
Affiliation:
Institute for Physics of Semiconductors, National Academy of Sciences of Ukraine, 45 Nauki Prospect, 03028 Kyiv, Ukraine ,
Nataliya V. Kotova
Affiliation:
Institute for Physics of Semiconductors, National Academy of Sciences of Ukraine, 45 Nauki Prospect, 03028 Kyiv, Ukraine ,
Denys O. Naumenko
Affiliation:
Institute for Physics of Semiconductors, National Academy of Sciences of Ukraine, 45 Nauki Prospect, 03028 Kyiv, Ukraine , Research Centre for Microsystems and Nanotechnology, Kaunas University of Technology, Studentu 65, LT-51369 Kaunas, Lithuania
Valentinas Snitka
Affiliation:
Research Centre for Microsystems and Nanotechnology, Kaunas University of Technology, Studentu 65, LT-51369 Kaunas, Lithuania
Get access

Abstract

Papers in the Appendix were published in electronic format as Volume 1534

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Smith, E., Dent, G., Modern Raman Spectroscopy: A Practical Approach (John Wiley & Sons, Chichester, 2005) p. 222.Google Scholar
Gouadec, G., Colomban, P., Prog. Cryst. Growth. Ch. 53 (1), 1 (2007).CrossRefGoogle Scholar
Naumenko, D., Snitka, V., Duch, M., Torras, N., Esteve, J., Microelectron Eng. 98, 488 (2012).CrossRefGoogle Scholar
Falkovsky, L A, Phys. Usp. 47, 249 (2004).CrossRefGoogle Scholar
Santinacci, L., Djenizian, T., Chimie, C. R. 11, 964 (2008).Google Scholar
Dmitruk, N., Barlas, T., Serdyuk, V., Physics and Chemistry of Solid State 11, 13 (2010).Google Scholar
Rojas-Lopez, M., Nieto-Navarro, J., Rosendo, E., Navarro-Contreras, H., Vidal, M.A., Thin Solid Films. 379, 1 (2000).CrossRefGoogle Scholar
Dmitruk, N, Barlas, T., Dmitruk, I., Kutovyi, S., Berezovska, N., Sabataityte, J., Simkiene, I., phys. stat. sol. (b) 247 (4), 955 (2010).Google Scholar
Schlierf, U., Lockwood, D.J., Graham, M.J., Schmuki, P., Electrochimica Acta. 49, 1743 (2004).CrossRefGoogle Scholar
Dmitruk, N.L., Goncharenko, A.V., Venger, E.F., Optics of small particles and composite media, (Naukova Dumka, Kyiv, 2009) p. 386.Google Scholar
Eustis, Susie and El-Sayed, Mostafa A., Chem. Soc. Rev. 35, 209 (2006).CrossRefGoogle Scholar
Moskovits, M., J. Raman Spectrosc. 36, 485 (2005).CrossRefGoogle Scholar
Dmitruk, M., Litovchenko, V., Strizshevsky, V., Surface Polaritons in Semiconductors and Dielectrics, (Naukova Dumka, Kyiv, 1989), p. 376.Google Scholar
Sarua, A., Monecke, J., Irmer, G., Tiginyanu, I.M., Gartner, G., Hartnagel, H L, Phys. Condens. Matter 13(31), 6687 (2001).CrossRefGoogle Scholar